TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY
An automated test bench for the study of the characteristics of various kinds of chips of mobile sources of regulated charge pump secondary power supply receiving energy from batteries was created. Having a modular structure, the test bench includes, in addition to the test charge pump module, power...
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| Format: | Article |
| Language: | Russian |
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MIREA - Russian Technological University
2016-06-01
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| Series: | Российский технологический журнал |
| Subjects: | |
| Online Access: | https://www.rtj-mirea.ru/jour/article/view/23 |
| _version_ | 1811281775211577344 |
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| author | V. K. Bityukov A. A. Ivanov A. V. Mironov N. G. Mikhnevich V. S. Perfiliev V. A. Petrov |
| author_facet | V. K. Bityukov A. A. Ivanov A. V. Mironov N. G. Mikhnevich V. S. Perfiliev V. A. Petrov |
| author_sort | V. K. Bityukov |
| collection | DOAJ |
| description | An automated test bench for the study of the characteristics of various kinds of chips of mobile sources of regulated charge pump secondary power supply receiving energy from batteries was created. Having a modular structure, the test bench includes, in addition to the test charge pump module, power supply, control, load, display modules, and a USB module for connection with a computer. The test bench enables carrying out research of various types of chips by changing only one small measuring board. The control module is based on PIC18F2550 microcontroller. The automated measuring system consists of a multimeter and oscilloscope. The investigated characteristics are output voltage as a function of load current, output voltage as a function of supply voltage, the forms of the output voltage ripple, the response of chips to a stepped load transition. One of the major goals of the research is to study algorithms of the charge pump circuits. A program for controlling the test bench by creating a virtual front panel was developed. Together with a virtual panel of the oscilloscope and available multimeter software this allows controlling the equipment operating parameters and making measurements remotely over the Internet. Using the created test bench new experimental data on all of the above characteristics for MAX1759 chip were obtained, and an algorithm of this chip in the buck mode operation was studied for the first time. |
| first_indexed | 2024-04-13T01:40:56Z |
| format | Article |
| id | doaj.art-83e2eabe7ff945edaceabfe1930e4886 |
| institution | Directory Open Access Journal |
| issn | 2500-316X |
| language | Russian |
| last_indexed | 2024-04-13T01:40:56Z |
| publishDate | 2016-06-01 |
| publisher | MIREA - Russian Technological University |
| record_format | Article |
| series | Российский технологический журнал |
| spelling | doaj.art-83e2eabe7ff945edaceabfe1930e48862022-12-22T03:08:12ZrusMIREA - Russian Technological UniversityРоссийский технологический журнал2500-316X2016-06-0143375210.32362/2500-316X-2016-4-3-37-5223TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLYV. K. Bityukov0A. A. Ivanov1A. V. Mironov2N. G. Mikhnevich3V. S. Perfiliev4V. A. Petrov5Moscow Тechnological University (MIREA)Moscow Тechnological University (MIREA)Moscow Тechnological University (MIREA)Moscow Тechnological University (MIREA)Moscow Тechnological University (MIREA)Moscow Тechnological University (MIREA)An automated test bench for the study of the characteristics of various kinds of chips of mobile sources of regulated charge pump secondary power supply receiving energy from batteries was created. Having a modular structure, the test bench includes, in addition to the test charge pump module, power supply, control, load, display modules, and a USB module for connection with a computer. The test bench enables carrying out research of various types of chips by changing only one small measuring board. The control module is based on PIC18F2550 microcontroller. The automated measuring system consists of a multimeter and oscilloscope. The investigated characteristics are output voltage as a function of load current, output voltage as a function of supply voltage, the forms of the output voltage ripple, the response of chips to a stepped load transition. One of the major goals of the research is to study algorithms of the charge pump circuits. A program for controlling the test bench by creating a virtual front panel was developed. Together with a virtual panel of the oscilloscope and available multimeter software this allows controlling the equipment operating parameters and making measurements remotely over the Internet. Using the created test bench new experimental data on all of the above characteristics for MAX1759 chip were obtained, and an algorithm of this chip in the buck mode operation was studied for the first time.https://www.rtj-mirea.ru/jour/article/view/23test benchintegrated circuit chipcharacteristicsalgorithmcharge pumpcontrol programvirtual panel |
| spellingShingle | V. K. Bityukov A. A. Ivanov A. V. Mironov N. G. Mikhnevich V. S. Perfiliev V. A. Petrov TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY Российский технологический журнал test bench integrated circuit chip characteristics algorithm charge pump control program virtual panel |
| title | TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY |
| title_full | TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY |
| title_fullStr | TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY |
| title_full_unstemmed | TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY |
| title_short | TEST BENCH FOR STUDYING CHARACTERISTICS OF INTEGRATED CIRCUIT CHIPS OF SECONDARY REGULATED CHARGE PUMP POWER SUPPLY |
| title_sort | test bench for studying characteristics of integrated circuit chips of secondary regulated charge pump power supply |
| topic | test bench integrated circuit chip characteristics algorithm charge pump control program virtual panel |
| url | https://www.rtj-mirea.ru/jour/article/view/23 |
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