An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation

High-frequency dispersion of the AlGaN/GaN HEMT output resistance has been investigated. Using the electron momentum balance equation, we demonstrated that the deviation of the dynamic drift velocity from its static value could be considered as the main reason for the high-frequency dispersion of th...

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Main Authors: Y. Pei, Amgad A. Al-Saman, Chengong Yin, Eugeny A. Ryndin, Fujiang Lin
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9596572/
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author Y. Pei
Amgad A. Al-Saman
Chengong Yin
Eugeny A. Ryndin
Fujiang Lin
author_facet Y. Pei
Amgad A. Al-Saman
Chengong Yin
Eugeny A. Ryndin
Fujiang Lin
author_sort Y. Pei
collection DOAJ
description High-frequency dispersion of the AlGaN/GaN HEMT output resistance has been investigated. Using the electron momentum balance equation, we demonstrated that the deviation of the dynamic drift velocity from its static value could be considered as the main reason for the high-frequency dispersion of the transistor output resistance. Moreover, a new intrinsic small-signal equivalent circuit has been proposed to consider the output resistance dispersion. Comparison with measured s- parameters have validated the proposed approach.
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spelling doaj.art-84d1037de96c4715b8aabe82a8cd4c132022-12-22T00:04:38ZengIEEEIEEE Journal of the Electron Devices Society2168-67342021-01-0191060106510.1109/JEDS.2021.31243279596572An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance EquationY. Pei0Amgad A. Al-Saman1https://orcid.org/0000-0002-8323-1714Chengong Yin2Eugeny A. Ryndin3https://orcid.org/0000-0001-6844-7106Fujiang Lin4https://orcid.org/0000-0001-9238-6737Device Technology Department, Dynax Semiconductor Inc., Suzhou, ChinaDevice Technology Department, Dynax Semiconductor Inc., Suzhou, ChinaDevice Technology Department, Dynax Semiconductor Inc., Suzhou, ChinaDepartment of Micro- and Nanoelectronics, Saint Petersburg Electrotechnical University “LETI”, Saint Petersburg, RussiaSchool of Microelectronics, University of Science and Technology of China, Hefei, ChinaHigh-frequency dispersion of the AlGaN/GaN HEMT output resistance has been investigated. Using the electron momentum balance equation, we demonstrated that the deviation of the dynamic drift velocity from its static value could be considered as the main reason for the high-frequency dispersion of the transistor output resistance. Moreover, a new intrinsic small-signal equivalent circuit has been proposed to consider the output resistance dispersion. Comparison with measured s- parameters have validated the proposed approach.https://ieeexplore.ieee.org/document/9596572/Gallium nitridehigh electron mobility transistorsfrequency dispersionsmall-signal model
spellingShingle Y. Pei
Amgad A. Al-Saman
Chengong Yin
Eugeny A. Ryndin
Fujiang Lin
An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation
IEEE Journal of the Electron Devices Society
Gallium nitride
high electron mobility transistors
frequency dispersion
small-signal model
title An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation
title_full An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation
title_fullStr An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation
title_full_unstemmed An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation
title_short An Intrinsic Small-Signal Equivalent Circuit Model for AlGaN/GaN HEMT Considering the Momentum Balance Equation
title_sort intrinsic small signal equivalent circuit model for algan gan hemt considering the momentum balance equation
topic Gallium nitride
high electron mobility transistors
frequency dispersion
small-signal model
url https://ieeexplore.ieee.org/document/9596572/
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