Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement

Terahertz time-domain spectroscopy systems driven by monolithic mode-locked laser diodes (MLLDs) exhibit bandwidths exceeding 1 THz and a peak dynamic range that can compete with other state-of-the-art systems. Their main difference compared to fiber-laser-driven systems is their ultra-high repetiti...

Full description

Bibliographic Details
Main Authors: Kevin Kolpatzeck, Xuan Liu, Lars Häring, Jan C. Balzer, Andreas Czylwik
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/16/5389
_version_ 1828714940140093440
author Kevin Kolpatzeck
Xuan Liu
Lars Häring
Jan C. Balzer
Andreas Czylwik
author_facet Kevin Kolpatzeck
Xuan Liu
Lars Häring
Jan C. Balzer
Andreas Czylwik
author_sort Kevin Kolpatzeck
collection DOAJ
description Terahertz time-domain spectroscopy systems driven by monolithic mode-locked laser diodes (MLLDs) exhibit bandwidths exceeding 1 THz and a peak dynamic range that can compete with other state-of-the-art systems. Their main difference compared to fiber-laser-driven systems is their ultra-high repetition rate of typically dozens of GHz. This makes them interesting for applications where the length of the terahertz path may not be precisely known and it enables the use of a very short and potentially fast optical delay unit. However, the phase accuracy of the system is limited by the accuracy with which the delay axes of subsequent measurements are synchronized. In this work, we utilize an all-fiber approach that uses the optical signal from the MLLD in a Mach–Zehnder interferometer to generate a reference signal that we use to synchronize the detected terahertz signals. We demonstrate transmission-mode thickness measurements of stacked layers of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>17</mn><mspace width="0.166667em"></mspace><mi mathvariant="sans-serif">μ</mi></mrow></semantics></math></inline-formula>m thick low-density polyethylene (LDPE) films.
first_indexed 2024-03-10T08:24:30Z
format Article
id doaj.art-855ba8d97fb84faaa5d7e9a26322c4e0
institution Directory Open Access Journal
issn 1424-8220
language English
last_indexed 2024-03-10T08:24:30Z
publishDate 2021-08-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj.art-855ba8d97fb84faaa5d7e9a26322c4e02023-11-22T09:38:54ZengMDPI AGSensors1424-82202021-08-012116538910.3390/s21165389Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness MeasurementKevin Kolpatzeck0Xuan Liu1Lars Häring2Jan C. Balzer3Andreas Czylwik4Chair of Communication Systems (NTS), Faculty of Engineering, University of Duisburg-Essen (UDE), 47057 Duisburg, GermanyChair of Communication Systems (NTS), Faculty of Engineering, University of Duisburg-Essen (UDE), 47057 Duisburg, GermanyChair of Communication Systems (NTS), Faculty of Engineering, University of Duisburg-Essen (UDE), 47057 Duisburg, GermanyChair of Communication Systems (NTS), Faculty of Engineering, University of Duisburg-Essen (UDE), 47057 Duisburg, GermanyChair of Communication Systems (NTS), Faculty of Engineering, University of Duisburg-Essen (UDE), 47057 Duisburg, GermanyTerahertz time-domain spectroscopy systems driven by monolithic mode-locked laser diodes (MLLDs) exhibit bandwidths exceeding 1 THz and a peak dynamic range that can compete with other state-of-the-art systems. Their main difference compared to fiber-laser-driven systems is their ultra-high repetition rate of typically dozens of GHz. This makes them interesting for applications where the length of the terahertz path may not be precisely known and it enables the use of a very short and potentially fast optical delay unit. However, the phase accuracy of the system is limited by the accuracy with which the delay axes of subsequent measurements are synchronized. In this work, we utilize an all-fiber approach that uses the optical signal from the MLLD in a Mach–Zehnder interferometer to generate a reference signal that we use to synchronize the detected terahertz signals. We demonstrate transmission-mode thickness measurements of stacked layers of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>17</mn><mspace width="0.166667em"></mspace><mi mathvariant="sans-serif">μ</mi></mrow></semantics></math></inline-formula>m thick low-density polyethylene (LDPE) films.https://www.mdpi.com/1424-8220/21/16/5389terahertztime-domain spectroscopymode-locked laser diodesynchronizationinterferometer
spellingShingle Kevin Kolpatzeck
Xuan Liu
Lars Häring
Jan C. Balzer
Andreas Czylwik
Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement
Sensors
terahertz
time-domain spectroscopy
mode-locked laser diode
synchronization
interferometer
title Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement
title_full Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement
title_fullStr Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement
title_full_unstemmed Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement
title_short Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement
title_sort ultra high repetition rate terahertz time domain spectroscopy for micrometer layer thickness measurement
topic terahertz
time-domain spectroscopy
mode-locked laser diode
synchronization
interferometer
url https://www.mdpi.com/1424-8220/21/16/5389
work_keys_str_mv AT kevinkolpatzeck ultrahighrepetitionrateterahertztimedomainspectroscopyformicrometerlayerthicknessmeasurement
AT xuanliu ultrahighrepetitionrateterahertztimedomainspectroscopyformicrometerlayerthicknessmeasurement
AT larsharing ultrahighrepetitionrateterahertztimedomainspectroscopyformicrometerlayerthicknessmeasurement
AT jancbalzer ultrahighrepetitionrateterahertztimedomainspectroscopyformicrometerlayerthicknessmeasurement
AT andreasczylwik ultrahighrepetitionrateterahertztimedomainspectroscopyformicrometerlayerthicknessmeasurement