A Method for Measuring Parameters of Defective Ellipse Based on Vision

Ellipse detection has a very wide range of applications in the field of object detection, especially in the geometric size detection of inclined microporous parts. However, due to the processing methods applied to the parts, there are certain defects in the features. The existing ellipse detection m...

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Bibliographic Details
Main Authors: He Zhang, Li Wang, Wenya Liu, Jiwen Cui, Jiubin Tan
Format: Article
Language:English
Published: MDPI AG 2023-07-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/14/6433

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