Degradation model constructed with the aid of dynamic Bayesian networks

This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predicts the condition of a technical system. Besides handling bi-directional reasoning, a major benefit of this degradation model using a DBN is its ability to adequately model stochastic processes as wel...

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Main Authors: Anselm Lorenzoni, Michael Kempf, Oliver Mannuß
Format: Article
Language:English
Published: Taylor & Francis Group 2017-01-01
Series:Cogent Engineering
Subjects:
Online Access:http://dx.doi.org/10.1080/23311916.2017.1395786
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author Anselm Lorenzoni
Michael Kempf
Oliver Mannuß
author_facet Anselm Lorenzoni
Michael Kempf
Oliver Mannuß
author_sort Anselm Lorenzoni
collection DOAJ
description This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predicts the condition of a technical system. Besides handling bi-directional reasoning, a major benefit of this degradation model using a DBN is its ability to adequately model stochastic processes as well as Markov chains. We will assume that the behavior of the degradation can be represented as a P–F-curve (also called degradation or life curve). The model developed here is able to combine information from expert knowledge, any kind of sensor and operating data as well as information from the machine operator. Using the Bayesian approach, uncertain knowledge can be handled appropriately. Thus it is even possible to take into account the environment and stress under which the component or system is operating. Hence, it is possible to detect potential failures at an early stage and initiate appropriate remedy and repair strategies prior to catastrophic failure.
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spelling doaj.art-87e9895a8efc4e5f984f2f645509d2362023-09-02T19:25:09ZengTaylor & Francis GroupCogent Engineering2331-19162017-01-014110.1080/23311916.2017.13957861395786Degradation model constructed with the aid of dynamic Bayesian networksAnselm Lorenzoni0Michael Kempf1Oliver Mannuß2Fraunhofer Institute for Manufacturing Engineering and Automation (IPA)Fraunhofer Institute for Manufacturing Engineering and Automation (IPA)Fraunhofer Institute for Manufacturing Engineering and Automation (IPA)This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predicts the condition of a technical system. Besides handling bi-directional reasoning, a major benefit of this degradation model using a DBN is its ability to adequately model stochastic processes as well as Markov chains. We will assume that the behavior of the degradation can be represented as a P–F-curve (also called degradation or life curve). The model developed here is able to combine information from expert knowledge, any kind of sensor and operating data as well as information from the machine operator. Using the Bayesian approach, uncertain knowledge can be handled appropriately. Thus it is even possible to take into account the environment and stress under which the component or system is operating. Hence, it is possible to detect potential failures at an early stage and initiate appropriate remedy and repair strategies prior to catastrophic failure.http://dx.doi.org/10.1080/23311916.2017.1395786degradationdynamic bayesian networksp–f-curvestochastic process
spellingShingle Anselm Lorenzoni
Michael Kempf
Oliver Mannuß
Degradation model constructed with the aid of dynamic Bayesian networks
Cogent Engineering
degradation
dynamic bayesian networks
p–f-curve
stochastic process
title Degradation model constructed with the aid of dynamic Bayesian networks
title_full Degradation model constructed with the aid of dynamic Bayesian networks
title_fullStr Degradation model constructed with the aid of dynamic Bayesian networks
title_full_unstemmed Degradation model constructed with the aid of dynamic Bayesian networks
title_short Degradation model constructed with the aid of dynamic Bayesian networks
title_sort degradation model constructed with the aid of dynamic bayesian networks
topic degradation
dynamic bayesian networks
p–f-curve
stochastic process
url http://dx.doi.org/10.1080/23311916.2017.1395786
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