Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications
Optical fault injection is a type of attack vector targeting cryptographic circuits where the adversary injects faults during system operation to bypass defenses or reveal secret information. Since preventing this kind of attack is generally impractical, most known countermeasures focus on indirect...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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IEEE
2023-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10335669/ |
| _version_ | 1797392269892911104 |
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| author | David Zooker Yoav Weizman Alexander Fish Osnat Keren |
| author_facet | David Zooker Yoav Weizman Alexander Fish Osnat Keren |
| author_sort | David Zooker |
| collection | DOAJ |
| description | Optical fault injection is a type of attack vector targeting cryptographic circuits where the adversary injects faults during system operation to bypass defenses or reveal secret information. Since preventing this kind of attack is generally impractical, most known countermeasures focus on indirect (logic based) or direct detection. Indirect detection mechanisms monitor the effects of optical fault injections in a circuit, whereas direct sensors track the illumination itself. In this paper, we present a compact <inline-formula> <tex-math notation="LaTeX">$1.29{\mu }\text{m}\times 1.8{\mu }\text{m}$ </tex-math></inline-formula> direct optical sensor implemented in 65nm CMOS technology located inside the digital logic fabric. Because it is based on standard CMOS technology, it can be implemented using standard design flow. Measurements on four dedicated chips showed high sensitivity to fault injection attacks: the sensor was 2 to 6 times more sensitive than the combinational logic it protects. As a result of the sub-Vt operation of the transistors, these sensors exhibited post-attack self-recovery ability and high reliability, with a false positive rate under PVT of less than 10−7. |
| first_indexed | 2024-03-08T23:44:49Z |
| format | Article |
| id | doaj.art-8813157311bd4b74a872cdca2d743b90 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-03-08T23:44:49Z |
| publishDate | 2023-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-8813157311bd4b74a872cdca2d743b902023-12-14T00:01:49ZengIEEEIEEE Access2169-35362023-01-011113626913627810.1109/ACCESS.2023.333800110335669Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security ApplicationsDavid Zooker0https://orcid.org/0000-0003-3136-8935Yoav Weizman1Alexander Fish2https://orcid.org/0000-0002-4994-1536Osnat Keren3https://orcid.org/0000-0002-3101-9551Faculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelFaculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelFaculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelFaculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelOptical fault injection is a type of attack vector targeting cryptographic circuits where the adversary injects faults during system operation to bypass defenses or reveal secret information. Since preventing this kind of attack is generally impractical, most known countermeasures focus on indirect (logic based) or direct detection. Indirect detection mechanisms monitor the effects of optical fault injections in a circuit, whereas direct sensors track the illumination itself. In this paper, we present a compact <inline-formula> <tex-math notation="LaTeX">$1.29{\mu }\text{m}\times 1.8{\mu }\text{m}$ </tex-math></inline-formula> direct optical sensor implemented in 65nm CMOS technology located inside the digital logic fabric. Because it is based on standard CMOS technology, it can be implemented using standard design flow. Measurements on four dedicated chips showed high sensitivity to fault injection attacks: the sensor was 2 to 6 times more sensitive than the combinational logic it protects. As a result of the sub-Vt operation of the transistors, these sensors exhibited post-attack self-recovery ability and high reliability, with a false positive rate under PVT of less than 10−7.https://ieeexplore.ieee.org/document/10335669/Direct sensorhardware securitylaser fault injectionoptical sensor |
| spellingShingle | David Zooker Yoav Weizman Alexander Fish Osnat Keren Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications IEEE Access Direct sensor hardware security laser fault injection optical sensor |
| title | Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications |
| title_full | Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications |
| title_fullStr | Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications |
| title_full_unstemmed | Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications |
| title_short | Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications |
| title_sort | silicon proven 1 29 x03bc m x00d7 1 8 x03bc m 65nm sub vt optical sensor for hardware security applications |
| topic | Direct sensor hardware security laser fault injection optical sensor |
| url | https://ieeexplore.ieee.org/document/10335669/ |
| work_keys_str_mv | AT davidzooker siliconproven129x03bcmx00d718x03bcm65nmsubvtopticalsensorforhardwaresecurityapplications AT yoavweizman siliconproven129x03bcmx00d718x03bcm65nmsubvtopticalsensorforhardwaresecurityapplications AT alexanderfish siliconproven129x03bcmx00d718x03bcm65nmsubvtopticalsensorforhardwaresecurityapplications AT osnatkeren siliconproven129x03bcmx00d718x03bcm65nmsubvtopticalsensorforhardwaresecurityapplications |