Double Laser for Depth Measurement of Thin Films of Ice
The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2015-09-01
|
| Series: | Sensors |
| Subjects: | |
| Online Access: | http://www.mdpi.com/1424-8220/15/10/25123 |
| _version_ | 1811185871054962688 |
|---|---|
| author | Manuel Domingo Beltrán Ramón Luna Molina Miguel Ángel Satorre Aznar Carmina Santonja Moltó Carlos Millán Verdú |
| author_facet | Manuel Domingo Beltrán Ramón Luna Molina Miguel Ángel Satorre Aznar Carmina Santonja Moltó Carlos Millán Verdú |
| author_sort | Manuel Domingo Beltrán |
| collection | DOAJ |
| description | The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances. |
| first_indexed | 2024-04-11T13:36:32Z |
| format | Article |
| id | doaj.art-8825dc6170a548a28308d80617e91ab6 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-04-11T13:36:32Z |
| publishDate | 2015-09-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-8825dc6170a548a28308d80617e91ab62022-12-22T04:21:26ZengMDPI AGSensors1424-82202015-09-011510251232513810.3390/s151025123s151025123Double Laser for Depth Measurement of Thin Films of IceManuel Domingo Beltrán0Ramón Luna Molina1Miguel Ángel Satorre Aznar2Carmina Santonja Moltó3Carlos Millán Verdú4Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, SpainCentro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, SpainCentro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, SpainCentro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, SpainCentro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, SpainThe use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances.http://www.mdpi.com/1424-8220/15/10/25123thin filmsthicknessrefractive index |
| spellingShingle | Manuel Domingo Beltrán Ramón Luna Molina Miguel Ángel Satorre Aznar Carmina Santonja Moltó Carlos Millán Verdú Double Laser for Depth Measurement of Thin Films of Ice Sensors thin films thickness refractive index |
| title | Double Laser for Depth Measurement of Thin Films of Ice |
| title_full | Double Laser for Depth Measurement of Thin Films of Ice |
| title_fullStr | Double Laser for Depth Measurement of Thin Films of Ice |
| title_full_unstemmed | Double Laser for Depth Measurement of Thin Films of Ice |
| title_short | Double Laser for Depth Measurement of Thin Films of Ice |
| title_sort | double laser for depth measurement of thin films of ice |
| topic | thin films thickness refractive index |
| url | http://www.mdpi.com/1424-8220/15/10/25123 |
| work_keys_str_mv | AT manueldomingobeltran doublelaserfordepthmeasurementofthinfilmsofice AT ramonlunamolina doublelaserfordepthmeasurementofthinfilmsofice AT miguelangelsatorreaznar doublelaserfordepthmeasurementofthinfilmsofice AT carminasantonjamolto doublelaserfordepthmeasurementofthinfilmsofice AT carlosmillanverdu doublelaserfordepthmeasurementofthinfilmsofice |