Double Laser for Depth Measurement of Thin Films of Ice

Double Laser for Depth Measurement of Thin Films of Ice

The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we...

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Bibliographic Details
Main Authors: Manuel Domingo Beltrán, Ramón Luna Molina, Miguel Ángel Satorre Aznar, Carmina Santonja Moltó, Carlos Millán Verdú
Format: Article
Language:English
Published: MDPI AG 2015-09-01
Series:Sensors
Subjects:
thin films
thickness
refractive index
Online Access:http://www.mdpi.com/1424-8220/15/10/25123

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