Characterizing the Chemical Structure of Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub> MXene by Angle-Resolved XPS Combined with Argon Ion Etching

Characterizing the Chemical Structure of Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub> MXene by Angle-Resolved XPS Combined with Argon Ion Etching

Angle-resolved XPS combined with argon ion etching was used to characterize the surface functional groups and the chemical structure of Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub> MXene. Survey scanning obtained on the sample surface showed that the sample mainly con...

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Bibliographic Details
Main Authors: Yangfan Lu, Dongsheng Li, Fu Liu
Format: Article
Language:English
Published: MDPI AG 2022-01-01
Series:Materials
Subjects:
MXene
Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub>
XPS
angle-resolved
ion etching
Online Access:https://www.mdpi.com/1996-1944/15/1/307

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