Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity.
The current-voltage characteristics of Ni contacts with the surfaces of ZnO thin films as well as single crystal (0001) ZnO substrate are investigated. The ZnO thin film shows a conversion from Ohmic to rectifying behavior when annealed at 800°C. Similar findings are also found on the Zn-polar surfa...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Public Library of Science (PLoS)
2014-01-01
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| Series: | PLoS ONE |
| Online Access: | http://europepmc.org/articles/PMC3900583?pdf=render |
| _version_ | 1818173716971913216 |
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| author | Kim Guan Saw Sau Siong Tneh Gaik Leng Tan Fong Kwong Yam Sha Shiong Ng Zainuriah Hassan |
| author_facet | Kim Guan Saw Sau Siong Tneh Gaik Leng Tan Fong Kwong Yam Sha Shiong Ng Zainuriah Hassan |
| author_sort | Kim Guan Saw |
| collection | DOAJ |
| description | The current-voltage characteristics of Ni contacts with the surfaces of ZnO thin films as well as single crystal (0001) ZnO substrate are investigated. The ZnO thin film shows a conversion from Ohmic to rectifying behavior when annealed at 800°C. Similar findings are also found on the Zn-polar surface of (0001) ZnO. The O-polar surface, however, only shows Ohmic behavior before and after annealing. The rectifying behavior observed on the Zn-polar and ZnO thin film surfaces is associated with the formation of nickel zinc oxide (Ni1-xZnxO, where x = 0.1, 0.2). The current-voltage characteristics suggest that a p-n junction is formed by Ni1-xZnxO (which is believed to be p-type) and ZnO (which is intrinsically n-type). The rectifying behavior for the ZnO thin film as a result of annealing suggests that its surface is Zn-terminated. Current-voltage measurements could possibly be used to determine the surface polarity of ZnO thin films. |
| first_indexed | 2024-12-11T19:32:56Z |
| format | Article |
| id | doaj.art-88743e1834be44968cd66ca15a43f056 |
| institution | Directory Open Access Journal |
| issn | 1932-6203 |
| language | English |
| last_indexed | 2024-12-11T19:32:56Z |
| publishDate | 2014-01-01 |
| publisher | Public Library of Science (PLoS) |
| record_format | Article |
| series | PLoS ONE |
| spelling | doaj.art-88743e1834be44968cd66ca15a43f0562022-12-22T00:53:14ZengPublic Library of Science (PLoS)PLoS ONE1932-62032014-01-0191e8654410.1371/journal.pone.0086544Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity.Kim Guan SawSau Siong TnehGaik Leng TanFong Kwong YamSha Shiong NgZainuriah HassanThe current-voltage characteristics of Ni contacts with the surfaces of ZnO thin films as well as single crystal (0001) ZnO substrate are investigated. The ZnO thin film shows a conversion from Ohmic to rectifying behavior when annealed at 800°C. Similar findings are also found on the Zn-polar surface of (0001) ZnO. The O-polar surface, however, only shows Ohmic behavior before and after annealing. The rectifying behavior observed on the Zn-polar and ZnO thin film surfaces is associated with the formation of nickel zinc oxide (Ni1-xZnxO, where x = 0.1, 0.2). The current-voltage characteristics suggest that a p-n junction is formed by Ni1-xZnxO (which is believed to be p-type) and ZnO (which is intrinsically n-type). The rectifying behavior for the ZnO thin film as a result of annealing suggests that its surface is Zn-terminated. Current-voltage measurements could possibly be used to determine the surface polarity of ZnO thin films.http://europepmc.org/articles/PMC3900583?pdf=render |
| spellingShingle | Kim Guan Saw Sau Siong Tneh Gaik Leng Tan Fong Kwong Yam Sha Shiong Ng Zainuriah Hassan Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity. PLoS ONE |
| title | Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity. |
| title_full | Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity. |
| title_fullStr | Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity. |
| title_full_unstemmed | Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity. |
| title_short | Ohmic-rectifying conversion of Ni contacts on ZnO and the possible determination of ZnO thin film surface polarity. |
| title_sort | ohmic rectifying conversion of ni contacts on zno and the possible determination of zno thin film surface polarity |
| url | http://europepmc.org/articles/PMC3900583?pdf=render |
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