A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals reg...
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Format: | Article |
Language: | English |
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MDPI AG
2022-08-01
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Series: | Sensors |
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Online Access: | https://www.mdpi.com/1424-8220/22/16/5972 |
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author | Kerstin Orend Christoph Baer Thomas Musch |
author_facet | Kerstin Orend Christoph Baer Thomas Musch |
author_sort | Kerstin Orend |
collection | DOAJ |
description | In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups. |
first_indexed | 2024-03-09T03:52:33Z |
format | Article |
id | doaj.art-88998605f33c49d3bd7d96b722f13f8f |
institution | Directory Open Access Journal |
issn | 1424-8220 |
language | English |
last_indexed | 2024-03-09T03:52:33Z |
publishDate | 2022-08-01 |
publisher | MDPI AG |
record_format | Article |
series | Sensors |
spelling | doaj.art-88998605f33c49d3bd7d96b722f13f8f2023-12-03T14:25:22ZengMDPI AGSensors1424-82202022-08-012216597210.3390/s22165972A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric WaveguidesKerstin Orend0Christoph Baer1Thomas Musch2Institute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, GermanyInstitute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, GermanyInstitute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, GermanyIn this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.https://www.mdpi.com/1424-8220/22/16/5972material characterizationdielectric waveguide3D printing |
spellingShingle | Kerstin Orend Christoph Baer Thomas Musch A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides Sensors material characterization dielectric waveguide 3D printing |
title | A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides |
title_full | A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides |
title_fullStr | A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides |
title_full_unstemmed | A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides |
title_short | A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides |
title_sort | compact measurement setup for material characterization in w band based on dielectric waveguides |
topic | material characterization dielectric waveguide 3D printing |
url | https://www.mdpi.com/1424-8220/22/16/5972 |
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