A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides

In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals reg...

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Main Authors: Kerstin Orend, Christoph Baer, Thomas Musch
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/16/5972
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author Kerstin Orend
Christoph Baer
Thomas Musch
author_facet Kerstin Orend
Christoph Baer
Thomas Musch
author_sort Kerstin Orend
collection DOAJ
description In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.
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spelling doaj.art-88998605f33c49d3bd7d96b722f13f8f2023-12-03T14:25:22ZengMDPI AGSensors1424-82202022-08-012216597210.3390/s22165972A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric WaveguidesKerstin Orend0Christoph Baer1Thomas Musch2Institute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, GermanyInstitute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, GermanyInstitute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, GermanyIn this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.https://www.mdpi.com/1424-8220/22/16/5972material characterizationdielectric waveguide3D printing
spellingShingle Kerstin Orend
Christoph Baer
Thomas Musch
A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
Sensors
material characterization
dielectric waveguide
3D printing
title A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
title_full A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
title_fullStr A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
title_full_unstemmed A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
title_short A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides
title_sort compact measurement setup for material characterization in w band based on dielectric waveguides
topic material characterization
dielectric waveguide
3D printing
url https://www.mdpi.com/1424-8220/22/16/5972
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