A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides

A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides

In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals reg...

Full description

Bibliographic Details
Main Authors: Kerstin Orend, Christoph Baer, Thomas Musch
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Sensors
Subjects:
material characterization
dielectric waveguide
3D printing
Online Access:https://www.mdpi.com/1424-8220/22/16/5972

Similar Items

Similar Items