Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements
Abstract Few‐layer black phosphorus (FLBP) is a 2D material that gains worldwide interest for its possible applications, mainly in electronics and optoelectronics. However, as FLBP is prone to a degradation process under environmental conditions, there is a need for a monitoring method allowing inve...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Wiley-VCH
2023-04-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202202289 |
| _version_ | 1797772534227140608 |
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| author | Małgorzata Szczerska Monika Kosowska Jakub Gierowski Mateusz Cieślik Mirosław Sawczak Paweł Jakóbczyk |
| author_facet | Małgorzata Szczerska Monika Kosowska Jakub Gierowski Mateusz Cieślik Mirosław Sawczak Paweł Jakóbczyk |
| author_sort | Małgorzata Szczerska |
| collection | DOAJ |
| description | Abstract Few‐layer black phosphorus (FLBP) is a 2D material that gains worldwide interest for its possible applications, mainly in electronics and optoelectronics. However, as FLBP is prone to a degradation process under environmental conditions, there is a need for a monitoring method allowing investigation of its surface quality. Among many techniques, optoelectronic ones have unique advantages of fast response, non‐contact, and non‐invasive operation. In this paper, a photonic method is presented for this purpose with a focus on the earliest stages of the degradation process. Measurements are performed using a fiber‐optic interferometer working at the wavelength of 1310 nm. Series of material characterization measurements, including scanning electron microscopy, X‐ray photoelectron spectroscopy, and Raman spectroscopy investigations are performed to examine the FLBP using a well‐established methodology. Two samples—with liquid exfoliated FLBP and with layers of supernatant—prepared in two different production processes are investigated over 3 h. A detailed presentation of the degradation process is provided. The results prove that the surface monitoring of FLBP is possible by registering optical signal changes correlated with the changes in optical parameters caused by the proceeding degradation process. |
| first_indexed | 2024-03-12T21:52:20Z |
| format | Article |
| id | doaj.art-88a7931b0f734772b0c1587a0e2a599f |
| institution | Directory Open Access Journal |
| issn | 2196-7350 |
| language | English |
| last_indexed | 2024-03-12T21:52:20Z |
| publishDate | 2023-04-01 |
| publisher | Wiley-VCH |
| record_format | Article |
| series | Advanced Materials Interfaces |
| spelling | doaj.art-88a7931b0f734772b0c1587a0e2a599f2023-07-26T01:35:54ZengWiley-VCHAdvanced Materials Interfaces2196-73502023-04-011012n/an/a10.1002/admi.202202289Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic MeasurementsMałgorzata Szczerska0Monika Kosowska1Jakub Gierowski2Mateusz Cieślik3Mirosław Sawczak4Paweł Jakóbczyk5Department of Metrology and Optoelectronics Faculty of Electronics Telecommunications and Informatics Gdańsk University of Technology 11/12 Narutowicza Street Gdańsk 80‐233 PolandFaculty of Telecommunications Computer Science and Electrical Engineering Bydgoszcz University of Science and Technology Al. prof. S. Kaliskiego 7 Bydgoszcz 85‐796 PolandDepartment of Metrology and Optoelectronics Faculty of Electronics Telecommunications and Informatics Gdańsk University of Technology 11/12 Narutowicza Street Gdańsk 80‐233 PolandInstitute of Nanotechnology and Materials Engineering Division of Electrochemistry and Surface Physical Chemistry Gdańsk University of Technology 11/12 Narutowicza Street Gdańsk 80‐233 PolandCentre for Plasma and Laser Engineering The Szewalski Institute of Fluid Flow Machinery Fiszera 14 Street Gdańsk 80‐231 PolandDepartment of Metrology and Optoelectronics Faculty of Electronics Telecommunications and Informatics Gdańsk University of Technology 11/12 Narutowicza Street Gdańsk 80‐233 PolandAbstract Few‐layer black phosphorus (FLBP) is a 2D material that gains worldwide interest for its possible applications, mainly in electronics and optoelectronics. However, as FLBP is prone to a degradation process under environmental conditions, there is a need for a monitoring method allowing investigation of its surface quality. Among many techniques, optoelectronic ones have unique advantages of fast response, non‐contact, and non‐invasive operation. In this paper, a photonic method is presented for this purpose with a focus on the earliest stages of the degradation process. Measurements are performed using a fiber‐optic interferometer working at the wavelength of 1310 nm. Series of material characterization measurements, including scanning electron microscopy, X‐ray photoelectron spectroscopy, and Raman spectroscopy investigations are performed to examine the FLBP using a well‐established methodology. Two samples—with liquid exfoliated FLBP and with layers of supernatant—prepared in two different production processes are investigated over 3 h. A detailed presentation of the degradation process is provided. The results prove that the surface monitoring of FLBP is possible by registering optical signal changes correlated with the changes in optical parameters caused by the proceeding degradation process.https://doi.org/10.1002/admi.202202289few‐layer black phosphorusphosphorenedegradationphotonic measurementsinterferometer |
| spellingShingle | Małgorzata Szczerska Monika Kosowska Jakub Gierowski Mateusz Cieślik Mirosław Sawczak Paweł Jakóbczyk Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements Advanced Materials Interfaces few‐layer black phosphorus phosphorene degradation photonic measurements interferometer |
| title | Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements |
| title_full | Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements |
| title_fullStr | Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements |
| title_full_unstemmed | Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements |
| title_short | Investigation of the Few‐Layer Black Phosphorus Degradation by the Photonic Measurements |
| title_sort | investigation of the few layer black phosphorus degradation by the photonic measurements |
| topic | few‐layer black phosphorus phosphorene degradation photonic measurements interferometer |
| url | https://doi.org/10.1002/admi.202202289 |
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