Highly Reliable Electrochemical Metallization Threshold Switch Through Conductive Filament Engineering Using Two‐Dimensional PtSe2 Insertion Layer
Abstract Electrochemical metallization threshold switch (ECM TS) has received significant attention for various applications owing to its high ON/OFF ratio, fast switching characteristics, and simple active electrode/dielectric layer/inert electrode structures. However, the excess diffusion of activ...
Main Authors: | Min‐Su Kim, Euyjin Park, Seung‐Geun Kim, Jae‐Hyeun Park, Seung‐Hwan Kim, Kyu‐Hyun Han, Hyun‐Yong Yu |
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Format: | Article |
Language: | English |
Published: |
Wiley-VCH
2023-03-01
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Series: | Advanced Materials Interfaces |
Subjects: | |
Online Access: | https://doi.org/10.1002/admi.202202296 |
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