Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition

In this study, we report the fabrication and characterization of ${LaM}{O}_{3}$ $(M={Fe},{Cr},{Mn})$ perovskite thin films deposited on FTO substrates via electrophoretic deposition (EPD). The x-ray diffraction (XRD) patterns showed the formation of the orthorhombic structure for ${LaFe}{O}_{3}$ and...

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Main Authors: Raghad K Aljurays, Aicha Loucif, Mabrook S Amer, Abdullah M AlMayouf
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:Materials Research Express
Subjects:
Online Access:https://doi.org/10.1088/2053-1591/ace0a5
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author Raghad K Aljurays
Aicha Loucif
Mabrook S Amer
Abdullah M AlMayouf
author_facet Raghad K Aljurays
Aicha Loucif
Mabrook S Amer
Abdullah M AlMayouf
author_sort Raghad K Aljurays
collection DOAJ
description In this study, we report the fabrication and characterization of ${LaM}{O}_{3}$ $(M={Fe},{Cr},{Mn})$ perovskite thin films deposited on FTO substrates via electrophoretic deposition (EPD). The x-ray diffraction (XRD) patterns showed the formation of the orthorhombic structure for ${LaFe}{O}_{3}$ and ${LaCr}{O}_{3}$ films and the trigonal structure for the ${LaMn}{O}_{3}$ film. The field-emission scanning electron microscopy (FE-SEM) micrographs revealed nano-spherical particles with an average grain size of about 50 nm covering the ${LaMn}{O}_{3}$ surface with fewer porosities compared to the other films. Moreover, the ${LaMn}{O}_{3}$ film exhibited a higher transparency in the visible region (∼84%). The estimated bandgaps of ${LaFe}{O}_{3},$ ${LaCr}{O}_{3},$ and ${LaMn}{O}_{3}$ perovskite films were found to be 2.17, 3.18, and 2.92 eV, respectively. In addition, the refractive indices of all deposited films were calculated using five empirical models that relate the refractive index to the bandgap, which consistently revealed a decrease in refractive index with an increase of bandgap energy This study holds significant implications for the field of perovskite thin films as we contribute new insights into the fabrication of lanthanum-based perovskite thin films using the EPD technique. The comprehensive characterization of microstructural, morphological, and optical properties provides valuable information for understanding the structure-property relationship in these materials. Furthermore, the determination of bandgaps and refractive indices enhances our understanding of the optical properties of perovskite films. The findings from this study pave the way for potential applications in optoelectronic devices, where fine-tuning of material properties is critical for optimal device performance.
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spelling doaj.art-897ef005b7574a209ce93b46b4c9b94e2023-08-09T16:10:20ZengIOP PublishingMaterials Research Express2053-15912023-01-0110606590210.1088/2053-1591/ace0a5Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic depositionRaghad K Aljurays0Aicha Loucif1https://orcid.org/0000-0002-3814-4128Mabrook S Amer2Abdullah M AlMayouf3https://orcid.org/0000-0001-9246-7684Department of Physics, College of Science, Qassim University , PO 64, Buraidah, 51452, Saudi ArabiaDepartment of Physics, College of Science, Qassim University , PO 64, Buraidah, 51452, Saudi ArabiaElectrochemical Sciences Research Chair (ESRC), Chemistry Department, College of Science, King Saud University , Riyadh, 11451, Saudi Arabia; K.A.CARE Energy Research and Innovation Center at Riyadh, Riyadh, 11451, Saudi ArabiaElectrochemical Sciences Research Chair (ESRC), Chemistry Department, College of Science, King Saud University , Riyadh, 11451, Saudi Arabia; K.A.CARE Energy Research and Innovation Center at Riyadh, Riyadh, 11451, Saudi ArabiaIn this study, we report the fabrication and characterization of ${LaM}{O}_{3}$ $(M={Fe},{Cr},{Mn})$ perovskite thin films deposited on FTO substrates via electrophoretic deposition (EPD). The x-ray diffraction (XRD) patterns showed the formation of the orthorhombic structure for ${LaFe}{O}_{3}$ and ${LaCr}{O}_{3}$ films and the trigonal structure for the ${LaMn}{O}_{3}$ film. The field-emission scanning electron microscopy (FE-SEM) micrographs revealed nano-spherical particles with an average grain size of about 50 nm covering the ${LaMn}{O}_{3}$ surface with fewer porosities compared to the other films. Moreover, the ${LaMn}{O}_{3}$ film exhibited a higher transparency in the visible region (∼84%). The estimated bandgaps of ${LaFe}{O}_{3},$ ${LaCr}{O}_{3},$ and ${LaMn}{O}_{3}$ perovskite films were found to be 2.17, 3.18, and 2.92 eV, respectively. In addition, the refractive indices of all deposited films were calculated using five empirical models that relate the refractive index to the bandgap, which consistently revealed a decrease in refractive index with an increase of bandgap energy This study holds significant implications for the field of perovskite thin films as we contribute new insights into the fabrication of lanthanum-based perovskite thin films using the EPD technique. The comprehensive characterization of microstructural, morphological, and optical properties provides valuable information for understanding the structure-property relationship in these materials. Furthermore, the determination of bandgaps and refractive indices enhances our understanding of the optical properties of perovskite films. The findings from this study pave the way for potential applications in optoelectronic devices, where fine-tuning of material properties is critical for optimal device performance.https://doi.org/10.1088/2053-1591/ace0a5LaMO3 (M = FeCrMn) perovskite thin filmsEPD techniqueoptical propertiesrefractive index
spellingShingle Raghad K Aljurays
Aicha Loucif
Mabrook S Amer
Abdullah M AlMayouf
Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition
Materials Research Express
LaMO3 (M = Fe
Cr
Mn) perovskite thin films
EPD technique
optical properties
refractive index
title Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition
title_full Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition
title_fullStr Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition
title_full_unstemmed Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition
title_short Preparation and characterization of lanthanum-based perovskite oxides LaMO3 (M=Fe, Cr, Mn) thin films by electrophoretic deposition
title_sort preparation and characterization of lanthanum based perovskite oxides lamo3 m fe cr mn thin films by electrophoretic deposition
topic LaMO3 (M = Fe
Cr
Mn) perovskite thin films
EPD technique
optical properties
refractive index
url https://doi.org/10.1088/2053-1591/ace0a5
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AT mabrooksamer preparationandcharacterizationoflanthanumbasedperovskiteoxideslamo3mfecrmnthinfilmsbyelectrophoreticdeposition
AT abdullahmalmayouf preparationandcharacterizationoflanthanumbasedperovskiteoxideslamo3mfecrmnthinfilmsbyelectrophoreticdeposition