Beam-induced motion correction for sub-megadalton cryo-EM particles
In electron cryo-microscopy (cryo-EM), the electron beam that is used for imaging also causes the sample to move. This motion blurs the images and limits the resolution attainable by single-particle analysis. In a previous Research article (Bai et al., 2013) we showed that correcting for this motion...
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| 格式: | 文件 |
| 语言: | English |
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eLife Sciences Publications Ltd
2014-08-01
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| 丛编: | eLife |
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| 在线阅读: | https://elifesciences.org/articles/03665 |