Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films
Abstract Antiferromagnetic CuMnAs thin films have attracted attention since the discovery of the manipulation of their magnetic structure via electrical, optical, and terahertz pulses, enabling convenient approaches for switching between magnetoresistive states of the film for information storage. H...
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Wiley-VCH
2024-01-01
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Online Access: | https://doi.org/10.1002/apxr.202300075 |
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author | Peter Kubaščík Andrej Farkaš Kamil Olejník Tinkara Troha Matěj Hývl Filip Krizek Deep Chandra Joshi Tomáš Ostatnický Jiří Jechumtál Miloš Surýnek Eva Schmoranzerová Richard P. Campion Jakub Zázvorka Vít Novák Petr Kužel Tomáš Jungwirth Petr Němec Lukáš Nádvorník |
author_facet | Peter Kubaščík Andrej Farkaš Kamil Olejník Tinkara Troha Matěj Hývl Filip Krizek Deep Chandra Joshi Tomáš Ostatnický Jiří Jechumtál Miloš Surýnek Eva Schmoranzerová Richard P. Campion Jakub Zázvorka Vít Novák Petr Kužel Tomáš Jungwirth Petr Němec Lukáš Nádvorník |
author_sort | Peter Kubaščík |
collection | DOAJ |
description | Abstract Antiferromagnetic CuMnAs thin films have attracted attention since the discovery of the manipulation of their magnetic structure via electrical, optical, and terahertz pulses, enabling convenient approaches for switching between magnetoresistive states of the film for information storage. However, the magnetic structure and, thus, the efficiency of the manipulation can be affected by the film morphology and growth defects. In this study, the properties of CuMnAs thin films are investigated by probing the asymmetrical growth‐related uniaxial anisotropy of electric conductivity by contact‐free terahertz transmission spectroscopy. It is shown that the terahertz measurements conveniently detect the conductivity anisotropy that is consistent with conventional DC Hall‐bar measurements. Moreover, the terahertz technique allows for considerably finer determination of anisotropy axes, and it is less sensitive to the local film degradation. Thanks to the averaging over a large detection area, the THz probing also allows an analysis of strongly non‐uniform thin films. Using scanning electron and near‐field terahertz microscopies, the observed anisotropic conductivity of CuMnAs is related to the elongation and orientation of growth defects, which both originate in the anisotropic growth of the films. In addition, control over the morphology of defects is demonstrated by using vicinal substrates. |
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language | English |
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spelling | doaj.art-8a943280fa3944a693bb6792d0e3251b2024-02-06T04:50:39ZengWiley-VCHAdvanced Physics Research2751-12002024-01-0131n/an/a10.1002/apxr.202300075Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin FilmsPeter Kubaščík0Andrej Farkaš1Kamil Olejník2Tinkara Troha3Matěj Hývl4Filip Krizek5Deep Chandra Joshi6Tomáš Ostatnický7Jiří Jechumtál8Miloš Surýnek9Eva Schmoranzerová10Richard P. Campion11Jakub Zázvorka12Vít Novák13Petr Kužel14Tomáš Jungwirth15Petr Němec16Lukáš Nádvorník17Faculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Cukrovarnická 10 Prague 6 16200 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Na Slovance 2 Prague 8 18200 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Cukrovarnická 10 Prague 6 16200 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Cukrovarnická 10 Prague 6 16200 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicSchool of Physics and Astronomy University of Nottingham Nottingham NG7 2RD UKFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Cukrovarnická 10 Prague 6 16200 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Na Slovance 2 Prague 8 18200 Czech RepublicInstitute of Physics of the Czech Academy of Sciences Cukrovarnická 10 Prague 6 16200 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicFaculty of Mathematics and Physics Charles University Ke Karlovu 3 Prague 2 12116 Czech RepublicAbstract Antiferromagnetic CuMnAs thin films have attracted attention since the discovery of the manipulation of their magnetic structure via electrical, optical, and terahertz pulses, enabling convenient approaches for switching between magnetoresistive states of the film for information storage. However, the magnetic structure and, thus, the efficiency of the manipulation can be affected by the film morphology and growth defects. In this study, the properties of CuMnAs thin films are investigated by probing the asymmetrical growth‐related uniaxial anisotropy of electric conductivity by contact‐free terahertz transmission spectroscopy. It is shown that the terahertz measurements conveniently detect the conductivity anisotropy that is consistent with conventional DC Hall‐bar measurements. Moreover, the terahertz technique allows for considerably finer determination of anisotropy axes, and it is less sensitive to the local film degradation. Thanks to the averaging over a large detection area, the THz probing also allows an analysis of strongly non‐uniform thin films. Using scanning electron and near‐field terahertz microscopies, the observed anisotropic conductivity of CuMnAs is related to the elongation and orientation of growth defects, which both originate in the anisotropic growth of the films. In addition, control over the morphology of defects is demonstrated by using vicinal substrates.https://doi.org/10.1002/apxr.202300075antiferromagnetic spintronicsCuMnAsgrowth defectsterahertz spectroscopyvicinal substrates |
spellingShingle | Peter Kubaščík Andrej Farkaš Kamil Olejník Tinkara Troha Matěj Hývl Filip Krizek Deep Chandra Joshi Tomáš Ostatnický Jiří Jechumtál Miloš Surýnek Eva Schmoranzerová Richard P. Campion Jakub Zázvorka Vít Novák Petr Kužel Tomáš Jungwirth Petr Němec Lukáš Nádvorník Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films Advanced Physics Research antiferromagnetic spintronics CuMnAs growth defects terahertz spectroscopy vicinal substrates |
title | Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films |
title_full | Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films |
title_fullStr | Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films |
title_full_unstemmed | Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films |
title_short | Terahertz Probing of Anisotropic Conductivity and Morphology of CuMnAs Epitaxial Thin Films |
title_sort | terahertz probing of anisotropic conductivity and morphology of cumnas epitaxial thin films |
topic | antiferromagnetic spintronics CuMnAs growth defects terahertz spectroscopy vicinal substrates |
url | https://doi.org/10.1002/apxr.202300075 |
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