Void Suppression in Glass Frit Bonding Via Three-Step Annealing Process
In this work, void formation was systematically observed for the glass frit bonding technique as a function of the annealing temperature, annealing time, and annealing ambient. High annealing temperature and long annealing time were adopted to reach the maximum heat flux to avoid voids/bubbles. As d...
Main Authors: | Yifang Liu, Junyu Chen, Jiaxin Jiang, Gaofeng Zheng |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-11-01
|
Series: | Micromachines |
Subjects: | |
Online Access: | https://www.mdpi.com/2072-666X/13/12/2104 |
Similar Items
-
An Experimental and Numerical Study on Glass Frit Wafer-to-Wafer Bonding
by: Seyed Amir Fouad Farshchi Yazdi, et al.
Published: (2023-01-01) -
Hermetic Seal of Organic Light Emitting Diode with Glass Frit
by: Chien-Liang Chiu, et al.
Published: (2021-12-01) -
Effect of glass frit composition on reliability of silver paste metallization in crystalline silicon solar cells
by: Huixin Li, et al.
Published: (2024-01-01) -
Assessment of oat genotypes for resistance to frit fly in the conditions of the Kirov region
by: O. A. Zhuikova, et al.
Published: (2022-10-01) -
Self-Healing Glass/Metakaolin-Based Geopolymer Composite Exposed to Molten Sodium Chloride and Potassium Chloride
by: Patrick F. Keane, et al.
Published: (2023-02-01)