Selective trapping of positrons by Ag nanolayers in a V/Ag multilayer system
V/Ag nano-scaled multilayers were prepared by using a magnetron sputtering deposition method. Each layer of Ag and V has a thickness of about 6 nm, and the total thickness of the multilayer film is 350 nm. Doppler broadening of annihilation radiation was measured by using a slow positron beam to stu...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2020-03-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5143379 |
| Summary: | V/Ag nano-scaled multilayers were prepared by using a magnetron sputtering deposition method. Each layer of Ag and V has a thickness of about 6 nm, and the total thickness of the multilayer film is 350 nm. Doppler broadening of annihilation radiation was measured by using a slow positron beam to study the microstructure of the above samples. It was found that the Doppler broadening S and W parameters measured in the V/Ag multilayers were close to those measured in the Ag reference sample. Coincidence Doppler broadening measurements also showed that the electron momentum distributions in V/Ag multilayers and Ag monolayer were almost identical. This suggests that Ag has a strong affinity to positrons, and almost all the positrons ejected into the multilayers are confined to the Ag nanolayers. Theoretical calculations indicate that the positron wavefunction is well localized in the Ag nanolayer even for a layer thickness of only 1 nm. |
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| ISSN: | 2158-3226 |