A machine perspective of atomic defects in scanning transmission electron microscopy
Abstract Enabled by the advances in aberration‐corrected scanning transmission electron microscopy (STEM), atomic‐resolution real space imaging of materials has allowed a direct structure‐property investigation. Traditional ways of quantitative data analysis suffer from low yield and poor accuracy....
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2019-09-01
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| Series: | InfoMat |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/inf2.12026 |