On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution
The Marshall–Olkin Extended Exponential distribution is introduced and reliability properties are studied. The p.d.f.’s of nth record value, joint p.d.f.’s, of mth and nth record values are derived to obtain the expression for mean, variance and covariance of reord values. The entropy of jth record...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Springer
2014-09-01
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| Series: | Journal of Statistical Theory and Applications (JSTA) |
| Subjects: | |
| Online Access: | https://www.atlantis-press.com/article/14341.pdf |
| _version_ | 1818187033970999296 |
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| author | K.K. Jose E. Krishna Miroslav M. Ristic |
| author_facet | K.K. Jose E. Krishna Miroslav M. Ristic |
| author_sort | K.K. Jose |
| collection | DOAJ |
| description | The Marshall–Olkin Extended Exponential distribution is introduced and reliability properties are studied. The p.d.f.’s of nth record value, joint p.d.f.’s, of mth and nth record values are derived to obtain the expression for mean, variance and covariance of reord values. The entropy of jth record value is derived.The stress strength analysis for the new model is carried out. We develop autoregressive processes and sample path properties are explored. The results are verified using simulations as well as graphical studies.The model is extended to higher orders also. |
| first_indexed | 2024-12-11T23:04:36Z |
| format | Article |
| id | doaj.art-8b936f0c35aa42e2a75112c6574e8b14 |
| institution | Directory Open Access Journal |
| issn | 1538-7887 |
| language | English |
| last_indexed | 2024-12-11T23:04:36Z |
| publishDate | 2014-09-01 |
| publisher | Springer |
| record_format | Article |
| series | Journal of Statistical Theory and Applications (JSTA) |
| spelling | doaj.art-8b936f0c35aa42e2a75112c6574e8b142022-12-22T00:46:59ZengSpringerJournal of Statistical Theory and Applications (JSTA)1538-78872014-09-0113310.2991/jsta.2014.13.3.6On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential DistributionK.K. JoseE. KrishnaMiroslav M. RisticThe Marshall–Olkin Extended Exponential distribution is introduced and reliability properties are studied. The p.d.f.’s of nth record value, joint p.d.f.’s, of mth and nth record values are derived to obtain the expression for mean, variance and covariance of reord values. The entropy of jth record value is derived.The stress strength analysis for the new model is carried out. We develop autoregressive processes and sample path properties are explored. The results are verified using simulations as well as graphical studies.The model is extended to higher orders also.https://www.atlantis-press.com/article/14341.pdfAuto regressive processes; Entropy; Exponential distribution; Marshall–Olkin distribution; Record values; Reliability; Sample path; Simulation; Stress-strength analysis |
| spellingShingle | K.K. Jose E. Krishna Miroslav M. Ristic On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution Journal of Statistical Theory and Applications (JSTA) Auto regressive processes; Entropy; Exponential distribution; Marshall–Olkin distribution; Record values; Reliability; Sample path; Simulation; Stress-strength analysis |
| title | On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution |
| title_full | On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution |
| title_fullStr | On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution |
| title_full_unstemmed | On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution |
| title_short | On Record Values and Reliability Properties of Marshall–Olkin Extended Exponential Distribution |
| title_sort | on record values and reliability properties of marshall olkin extended exponential distribution |
| topic | Auto regressive processes; Entropy; Exponential distribution; Marshall–Olkin distribution; Record values; Reliability; Sample path; Simulation; Stress-strength analysis |
| url | https://www.atlantis-press.com/article/14341.pdf |
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