Detailed Successive Layer Modeling and Design Factor Analysis for Single Micro-LED Pixel

Detailed Successive Layer Modeling and Design Factor Analysis for Single Micro-LED Pixel

The major factors associated with the manufactured structures and photon emission intensity distribution must be accurately identified for the complicated optical design parameters associated with micro-LED pixels. This study presents the methodologies and reveals the sequential calculating protocol...

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Sonraí bibleagrafaíochta
Príomhchruthaitheoirí: Chung-Jen Ou, Kai-Ping Chang, Ming-Wei Tasi, Chien-Chih Chen, Yu-Min Chen, Chih-Wei Lo, Dong-Sing Wuu
Formáid: Alt
Teanga:English
Foilsithe / Cruthaithe: IEEE 2022-01-01
Sraith:IEEE Photonics Journal
Ábhair:
Micro-LED pixel
taguchi method
ray-tracing program
boundary conditions
DOE method
far-field receiver
Rochtain ar líne:https://ieeexplore.ieee.org/document/9935123/

Ar líne

https://ieeexplore.ieee.org/document/9935123/

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