Maximal frequent sequence based test suite reduction through DU-pairs

<p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic...

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Bibliographic Details
Main Authors: Narendra Kumar Rao Bangole, RamaMohan Reddy Ambati
Format: Article
Language:English
Published: Klaipėda University 2014-08-01
Series:Computational Science and Techniques
Online Access:http://journals.ku.lt/index.php/CST/article/view/396
Description
Summary:<p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic code coverage requirement under consideration for test suite reduction. This algorithm farewell when compared with few other algorithms like Harrold Gupta and Soffa (HGS) and Bi-Objective Greedy (BOG) algorithms and Greedy algorithms in covering all the DU-Pairs. The coverage criteria achieved is 100% in many cases, except for few insufficient and incomplete test suites.</p><p>DOI: http://dx.doi.org/10.15181/csat.v2i1.396</p>
ISSN:2029-9966