Maximal frequent sequence based test suite reduction through DU-pairs
<p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic...
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Format: | Article |
Language: | English |
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Klaipėda University
2014-08-01
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Series: | Computational Science and Techniques |
Online Access: | http://journals.ku.lt/index.php/CST/article/view/396 |
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author | Narendra Kumar Rao Bangole RamaMohan Reddy Ambati |
author_facet | Narendra Kumar Rao Bangole RamaMohan Reddy Ambati |
author_sort | Narendra Kumar Rao Bangole |
collection | DOAJ |
description | <p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic code coverage requirement under consideration for test suite reduction. This algorithm farewell when compared with few other algorithms like Harrold Gupta and Soffa (HGS) and Bi-Objective Greedy (BOG) algorithms and Greedy algorithms in covering all the DU-Pairs. The coverage criteria achieved is 100% in many cases, except for few insufficient and incomplete test suites.</p><p>DOI: http://dx.doi.org/10.15181/csat.v2i1.396</p> |
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format | Article |
id | doaj.art-8c8777083b434c5085cf3fbe3b52264d |
institution | Directory Open Access Journal |
issn | 2029-9966 |
language | English |
last_indexed | 2024-12-13T22:57:00Z |
publishDate | 2014-08-01 |
publisher | Klaipėda University |
record_format | Article |
series | Computational Science and Techniques |
spelling | doaj.art-8c8777083b434c5085cf3fbe3b52264d2022-12-21T23:28:29ZengKlaipėda UniversityComputational Science and Techniques2029-99662014-08-012127628810.15181/csat.v2i1.396781Maximal frequent sequence based test suite reduction through DU-pairsNarendra Kumar Rao Bangole0RamaMohan Reddy Ambati1Research Scholar, CSE,Dept. JNTU College of Engineering, JNTUH, Hyderabad,Professor, SV University College of Engineering,Tirupati,<p>The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic code coverage requirement under consideration for test suite reduction. This algorithm farewell when compared with few other algorithms like Harrold Gupta and Soffa (HGS) and Bi-Objective Greedy (BOG) algorithms and Greedy algorithms in covering all the DU-Pairs. The coverage criteria achieved is 100% in many cases, except for few insufficient and incomplete test suites.</p><p>DOI: http://dx.doi.org/10.15181/csat.v2i1.396</p>http://journals.ku.lt/index.php/CST/article/view/396 |
spellingShingle | Narendra Kumar Rao Bangole RamaMohan Reddy Ambati Maximal frequent sequence based test suite reduction through DU-pairs Computational Science and Techniques |
title | Maximal frequent sequence based test suite reduction through DU-pairs |
title_full | Maximal frequent sequence based test suite reduction through DU-pairs |
title_fullStr | Maximal frequent sequence based test suite reduction through DU-pairs |
title_full_unstemmed | Maximal frequent sequence based test suite reduction through DU-pairs |
title_short | Maximal frequent sequence based test suite reduction through DU-pairs |
title_sort | maximal frequent sequence based test suite reduction through du pairs |
url | http://journals.ku.lt/index.php/CST/article/view/396 |
work_keys_str_mv | AT narendrakumarraobangole maximalfrequentsequencebasedtestsuitereductionthroughdupairs AT ramamohanreddyambati maximalfrequentsequencebasedtestsuitereductionthroughdupairs |