An Algorithm of Acoustic Emission Location for Complex Composite Structure

Acoustic emission (AE) is widely used in engineering and rock mechanics. The algorithm of AE location based on homogeneous medium or single velocity structure is confronted with lower accuracy when it is applied to the actual working conditions that are prevailing complicated and heterogeneous. In t...

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Bibliographic Details
Main Authors: Peixun Liu, Yanshuang Guo, Yanqun Zhuo, Wenbo Qi, Jiahui Feng, Hao Chen, Shunyun Chen
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/23/12323
Description
Summary:Acoustic emission (AE) is widely used in engineering and rock mechanics. The algorithm of AE location based on homogeneous medium or single velocity structure is confronted with lower accuracy when it is applied to the actual working conditions that are prevailing complicated and heterogeneous. In this paper, an AE location algorithm based on complex composite structure (CCS) is proposed via carrying out the following studies: (1) A new travel time calculation scheme suitable for CCS with step-like velocity change is proposed based on an optimized shortest path algorithm. By doing this, a reasonable ray path that is only deflected at the interface is obtained to improve the travel time accuracy. The time complexity of the new algorithm is <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>O</mi><mrow><mo>(</mo><mrow><mi>n</mi><msub><mrow><mi>log</mi></mrow><mn>2</mn></msub><mi>n</mi></mrow><mo>)</mo></mrow></mrow></semantics></math></inline-formula>. (2) The availability of the new algorithm is verified via a theoretical analysis under a one-dimensional velocity structure as well as an AE experiment using a complex structure under artificial excitation. (3) The AE location during the failure of a simulated CCS in the laboratory indicates that the new algorithm can effectively calculate the travel time and ray path of the sample.
ISSN:2076-3417