A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs
Increased density of printed circuit board assembles (PCBAs) is diminishing physical contact test access of the in-circuit testing (ICT) solutions for defects detection. As a result, it is necessary to design contactless test solutions with high spatial resolution to overcome the current test limita...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9252956/ |
| _version_ | 1819275068886220800 |
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| author | Tie Qiu Choon Kait Andrew Tek Shao Ying Huang |
| author_facet | Tie Qiu Choon Kait Andrew Tek Shao Ying Huang |
| author_sort | Tie Qiu |
| collection | DOAJ |
| description | Increased density of printed circuit board assembles (PCBAs) is diminishing physical contact test access of the in-circuit testing (ICT) solutions for defects detection. As a result, it is necessary to design contactless test solutions with high spatial resolution to overcome the current test limitations. In this paper, a compact contactless sensor is presented for monitoring the fabrication quality of PCBAs. The sensor consists of an inductor-capacitor-(LC)-based resonant circuit and it can detect defects on metallic traces of PCBAs in close proximity without a contact. The sensor is designed such that, strong electric field is confined around the sensor tip, which creates strong capacitive coupling between the sensor tip and devices under test (DUTs) within a small region for sensing, i.e. high resolution sensing. The sensitivity of the proposed sensor is verified by the simulated and experimental 2D surface mapping results with sample DUTs, and it shows that the sensor can detect the open or short defects with a size as small as 0.15 mm × 0.2 mm. Circuit models are proposed to predict the sensing behavior and for guiding the design. The proposed sensor shows great potential to be used in the real-time monitoring of defects along the manufacturing supply chain. |
| first_indexed | 2024-12-23T23:18:27Z |
| format | Article |
| id | doaj.art-8d02e2695ddc4c319305795adf810b30 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-12-23T23:18:27Z |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-8d02e2695ddc4c319305795adf810b302022-12-21T17:26:24ZengIEEEIEEE Access2169-35362020-01-01820375820376810.1109/ACCESS.2020.30368849252956A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAsTie Qiu0https://orcid.org/0000-0002-2176-2501Choon Kait Andrew Tek1https://orcid.org/0000-0002-4910-9168Shao Ying Huang2https://orcid.org/0000-0003-3775-8205Engineering Product Development Pillar, Singapore University of Technology and Design, SingaporeElectronic Industrial Solutions Group-Centers of Excellence, Keysight Technologies, SingaporeEngineering Product Development Pillar, Singapore University of Technology and Design, SingaporeIncreased density of printed circuit board assembles (PCBAs) is diminishing physical contact test access of the in-circuit testing (ICT) solutions for defects detection. As a result, it is necessary to design contactless test solutions with high spatial resolution to overcome the current test limitations. In this paper, a compact contactless sensor is presented for monitoring the fabrication quality of PCBAs. The sensor consists of an inductor-capacitor-(LC)-based resonant circuit and it can detect defects on metallic traces of PCBAs in close proximity without a contact. The sensor is designed such that, strong electric field is confined around the sensor tip, which creates strong capacitive coupling between the sensor tip and devices under test (DUTs) within a small region for sensing, i.e. high resolution sensing. The sensitivity of the proposed sensor is verified by the simulated and experimental 2D surface mapping results with sample DUTs, and it shows that the sensor can detect the open or short defects with a size as small as 0.15 mm × 0.2 mm. Circuit models are proposed to predict the sensing behavior and for guiding the design. The proposed sensor shows great potential to be used in the real-time monitoring of defects along the manufacturing supply chain.https://ieeexplore.ieee.org/document/9252956/In-circuit testing (ICT)printed circuit board (PCB)printed circuit board assembly (PCBA)sensingnear-field sensingnon-destructive evaluation (NDE) |
| spellingShingle | Tie Qiu Choon Kait Andrew Tek Shao Ying Huang A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs IEEE Access In-circuit testing (ICT) printed circuit board (PCB) printed circuit board assembly (PCBA) sensing near-field sensing non-destructive evaluation (NDE) |
| title | A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs |
| title_full | A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs |
| title_fullStr | A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs |
| title_full_unstemmed | A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs |
| title_short | A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs |
| title_sort | compact high resolution resonance based capacitive sensor for defects detection on pcbas |
| topic | In-circuit testing (ICT) printed circuit board (PCB) printed circuit board assembly (PCBA) sensing near-field sensing non-destructive evaluation (NDE) |
| url | https://ieeexplore.ieee.org/document/9252956/ |
| work_keys_str_mv | AT tieqiu acompacthighresolutionresonancebasedcapacitivesensorfordefectsdetectiononpcbas AT choonkaitandrewtek acompacthighresolutionresonancebasedcapacitivesensorfordefectsdetectiononpcbas AT shaoyinghuang acompacthighresolutionresonancebasedcapacitivesensorfordefectsdetectiononpcbas AT tieqiu compacthighresolutionresonancebasedcapacitivesensorfordefectsdetectiononpcbas AT choonkaitandrewtek compacthighresolutionresonancebasedcapacitivesensorfordefectsdetectiononpcbas AT shaoyinghuang compacthighresolutionresonancebasedcapacitivesensorfordefectsdetectiononpcbas |