A Compact High-Resolution Resonance-Based Capacitive Sensor for Defects Detection on PCBAs
Increased density of printed circuit board assembles (PCBAs) is diminishing physical contact test access of the in-circuit testing (ICT) solutions for defects detection. As a result, it is necessary to design contactless test solutions with high spatial resolution to overcome the current test limita...
Main Authors: | Tie Qiu, Choon Kait Andrew Tek, Shao Ying Huang |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9252956/ |
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