Two-Dimensional Transient Cycle Decomposition and Reduction (CDR) for Data Driven Nonlinear Dynamic System Modeling

Two-Dimensional Transient Cycle Decomposition and Reduction (CDR) for Data Driven Nonlinear Dynamic System Modeling

Transient test cycles are an essential part of the development of both on and off-highway vehicles and machines. These cycles are used to test and validate the dynamic operation and performance of systems and they also form part of regulations such as Real-world Driving Emissions (RDE). A common app...

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Xehetasun bibliografikoak
Egile Nagusiak: Zhijia Yang, Byron Mason, Edward Winward, Mark Cary
Formatua: Artikulua
Hizkuntza:English
Argitaratua: IEEE 2024-01-01
Saila:IEEE Access
Gaiak:
Clustering
cycle decomposition
Markov chain model
nonlinear dynamic modeling
Sarrera elektronikoa:https://ieeexplore.ieee.org/document/10463022/

Internet

https://ieeexplore.ieee.org/document/10463022/

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