Design and test of a C band local oscillator and clock device in LLRF

BackgroundThe linear accelerator of Shanghai soft X-ray free-electron laser facility (SXFEL) operates at 5 712 MHz frequency. In the low level radio frequency (LLRF) system, C band microwave signals were down converted from the 5 686.556 MHz local oscillator (LO) signal to 26.444 MHz intermediate (I...

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Main Authors: XIAO Chengcheng, YIN Zhe, ZHANG Junqiang, GU Qiang
Format: Article
Language:zho
Published: Science Press 2021-01-01
Series:He jishu
Subjects:
Online Access:http://www.hjs.sinap.ac.cn/thesisDetails#10.11889/j.0253-3219.2021.hjs.44.010201&lang=zh
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author XIAO Chengcheng
YIN Zhe
ZHANG Junqiang
GU Qiang
author_facet XIAO Chengcheng
YIN Zhe
ZHANG Junqiang
GU Qiang
author_sort XIAO Chengcheng
collection DOAJ
description BackgroundThe linear accelerator of Shanghai soft X-ray free-electron laser facility (SXFEL) operates at 5 712 MHz frequency. In the low level radio frequency (LLRF) system, C band microwave signals were down converted from the 5 686.556 MHz local oscillator (LO) signal to 26.444 MHz intermediate (IM) signal, and then quadruple frequency sampled by the 105.778 MHz clock signal. The stability of LO signal and clock signal can make great influence on the performance of the LLRF system.PurposeThis study aims to design and manufacture a local oscillator and clock device for satisfying the theoretical design requirements of the LLRF in SXFEL.MethodThe LO signal and clock signal were designed to be auto-correlated with the master oscillator signal. All the functional discrete device modules were installed in a shielded aluminum alloy shell, and were matched and interconnected by RF connectors after debugging and testing separately. The phase jitter integral of clock signal and LO signal, as well as the possible temperature sensitive nonlinear modules, i.e., temperature control of frequency divider and frequency multiplier, in clock Lo equipment were experimentally tested.ResultsThe experimental results show that the additional phase jitter integral of LO signal is 21.43 fs, better than the requirement of 40 fs.ConclusionsThe performance of this manufactured LO and clock device can meet the theoretical requirement of the SXFEL.
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spelling doaj.art-8d46ee27e60942e3b522c7983e0d227c2023-02-07T07:46:09ZzhoScience PressHe jishu0253-32192021-01-0144101020101020110.11889/j.0253-3219.2021.hjs.44.0102010253-3219(2021)01-0035-08Design and test of a C band local oscillator and clock device in LLRFXIAO Chengcheng0YIN Zhe1ZHANG Junqiang2GU Qiang3Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai Synchrotron Radiation Facility, Shanghai 201204, ChinaHebei Signal Microwave, Shijiazhuang 050200, ChinaShanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai Synchrotron Radiation Facility, Shanghai 201204, ChinaShanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai Synchrotron Radiation Facility, Shanghai 201204, ChinaBackgroundThe linear accelerator of Shanghai soft X-ray free-electron laser facility (SXFEL) operates at 5 712 MHz frequency. In the low level radio frequency (LLRF) system, C band microwave signals were down converted from the 5 686.556 MHz local oscillator (LO) signal to 26.444 MHz intermediate (IM) signal, and then quadruple frequency sampled by the 105.778 MHz clock signal. The stability of LO signal and clock signal can make great influence on the performance of the LLRF system.PurposeThis study aims to design and manufacture a local oscillator and clock device for satisfying the theoretical design requirements of the LLRF in SXFEL.MethodThe LO signal and clock signal were designed to be auto-correlated with the master oscillator signal. All the functional discrete device modules were installed in a shielded aluminum alloy shell, and were matched and interconnected by RF connectors after debugging and testing separately. The phase jitter integral of clock signal and LO signal, as well as the possible temperature sensitive nonlinear modules, i.e., temperature control of frequency divider and frequency multiplier, in clock Lo equipment were experimentally tested.ResultsThe experimental results show that the additional phase jitter integral of LO signal is 21.43 fs, better than the requirement of 40 fs.ConclusionsThe performance of this manufactured LO and clock device can meet the theoretical requirement of the SXFEL.http://www.hjs.sinap.ac.cn/thesisDetails#10.11889/j.0253-3219.2021.hjs.44.010201&lang=zhllrfc bandlocal oscillator and clockphase jittertemperature control
spellingShingle XIAO Chengcheng
YIN Zhe
ZHANG Junqiang
GU Qiang
Design and test of a C band local oscillator and clock device in LLRF
He jishu
llrf
c band
local oscillator and clock
phase jitter
temperature control
title Design and test of a C band local oscillator and clock device in LLRF
title_full Design and test of a C band local oscillator and clock device in LLRF
title_fullStr Design and test of a C band local oscillator and clock device in LLRF
title_full_unstemmed Design and test of a C band local oscillator and clock device in LLRF
title_short Design and test of a C band local oscillator and clock device in LLRF
title_sort design and test of a c band local oscillator and clock device in llrf
topic llrf
c band
local oscillator and clock
phase jitter
temperature control
url http://www.hjs.sinap.ac.cn/thesisDetails#10.11889/j.0253-3219.2021.hjs.44.010201&lang=zh
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AT yinzhe designandtestofacbandlocaloscillatorandclockdeviceinllrf
AT zhangjunqiang designandtestofacbandlocaloscillatorandclockdeviceinllrf
AT guqiang designandtestofacbandlocaloscillatorandclockdeviceinllrf