Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs

This paper presents the effects of optical radiation on the behavior of two scaled-gate aluminum gallium nitride/gallium nitride (AlGaN/GaN) high electron mobility transistors (HEMTs). The tested devices, having a gate width of 100 and 200 µm and a gate length of 0.25 µm, were expo...

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Main Authors: Alina Caddemi, Emanuele Cardillo, Salvatore Patanè, Claudia Triolo
Format: Article
Language:English
Published: MDPI AG 2019-06-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/8/6/698
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author Alina Caddemi
Emanuele Cardillo
Salvatore Patanè
Claudia Triolo
author_facet Alina Caddemi
Emanuele Cardillo
Salvatore Patanè
Claudia Triolo
author_sort Alina Caddemi
collection DOAJ
description This paper presents the effects of optical radiation on the behavior of two scaled-gate aluminum gallium nitride/gallium nitride (AlGaN/GaN) high electron mobility transistors (HEMTs). The tested devices, having a gate width of 100 and 200 µm and a gate length of 0.25 µm, were exposed to a laser beam with a wavelength of 404 nm (blue-ray) in order to investigate the main optical effects on the DC characteristics. Owing to the threshold shift and the charge generation, a marked increase of the gate and drain current was noticed. The occurrence of the kink effect in the absence of light exposure was identified, and a hypothesis about its origin is provided. The obtained results agree with the analysis previously carried out on gallium arsenide (GaAs)-based devices.
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spelling doaj.art-8d7d13ae8f0b4adfb9ccef08fe066eab2022-12-22T04:27:26ZengMDPI AGElectronics2079-92922019-06-018669810.3390/electronics8060698electronics8060698Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTsAlina Caddemi0Emanuele Cardillo1Salvatore Patanè2Claudia Triolo3Department of Engineering, University of Messina, 98166 Messina, ItalyDepartment of Engineering, University of Messina, 98166 Messina, ItalyDipartimento di Scienze Matematiche e Informatiche, Scienze Fisiche e Scienze della Terra, University of Messina, 98166 Messina, ItalyDipartimento di Scienze Matematiche e Informatiche, Scienze Fisiche e Scienze della Terra, University of Messina, 98166 Messina, ItalyThis paper presents the effects of optical radiation on the behavior of two scaled-gate aluminum gallium nitride/gallium nitride (AlGaN/GaN) high electron mobility transistors (HEMTs). The tested devices, having a gate width of 100 and 200 µm and a gate length of 0.25 µm, were exposed to a laser beam with a wavelength of 404 nm (blue-ray) in order to investigate the main optical effects on the DC characteristics. Owing to the threshold shift and the charge generation, a marked increase of the gate and drain current was noticed. The occurrence of the kink effect in the absence of light exposure was identified, and a hypothesis about its origin is provided. The obtained results agree with the analysis previously carried out on gallium arsenide (GaAs)-based devices.https://www.mdpi.com/2079-9292/8/6/698GaN HEMToptical behaviorlight exposurelaserkink effect
spellingShingle Alina Caddemi
Emanuele Cardillo
Salvatore Patanè
Claudia Triolo
Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs
Electronics
GaN HEMT
optical behavior
light exposure
laser
kink effect
title Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs
title_full Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs
title_fullStr Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs
title_full_unstemmed Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs
title_short Light Exposure Effects on the DC Kink of AlGaN/GaN HEMTs
title_sort light exposure effects on the dc kink of algan gan hemts
topic GaN HEMT
optical behavior
light exposure
laser
kink effect
url https://www.mdpi.com/2079-9292/8/6/698
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AT emanuelecardillo lightexposureeffectsonthedckinkofalganganhemts
AT salvatorepatane lightexposureeffectsonthedckinkofalganganhemts
AT claudiatriolo lightexposureeffectsonthedckinkofalganganhemts