Background signals in stimulated Raman scattering microscopy and current solutions to avoid them

ABSTRACTStimulated Raman scattering (SRS) microscopy has gained popularity in recent years due to its linearity to molecule concentration and laser intensity, and to the lack of the nonresonant background that affects its analogous technique, coherent anti-Stokes Raman scattering. However, SRS is no...

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Main Authors: Luca Genchi, Sergey P. Laptenok, Carlo Liberale
Format: Article
Language:English
Published: Taylor & Francis Group 2023-12-01
Series:Advances in Physics: X
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/23746149.2023.2176258
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author Luca Genchi
Sergey P. Laptenok
Carlo Liberale
author_facet Luca Genchi
Sergey P. Laptenok
Carlo Liberale
author_sort Luca Genchi
collection DOAJ
description ABSTRACTStimulated Raman scattering (SRS) microscopy has gained popularity in recent years due to its linearity to molecule concentration and laser intensity, and to the lack of the nonresonant background that affects its analogous technique, coherent anti-Stokes Raman scattering. However, SRS is not a background-free technique. In fact, there are other optical processes – nonlinear transient scattering and nonlinear transient absorption – that can be detrimental to the contrast and sensitivity of SRS microscopy. In this review, we provide a description of these competing optical processes and present an up-to-date description of current solutions to minimize their effect on SRS measurements.
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spelling doaj.art-8d87ad1dbc8147d6a175dcad9df5d2c02023-10-19T13:03:27ZengTaylor & Francis GroupAdvances in Physics: X2374-61492023-12-018110.1080/23746149.2023.2176258Background signals in stimulated Raman scattering microscopy and current solutions to avoid themLuca Genchi0Sergey P. Laptenok1Carlo Liberale2Biological and Environmental Science and Engineering Division (BESE), King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi ArabiaBiological and Environmental Science and Engineering Division (BESE), King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi ArabiaBiological and Environmental Science and Engineering Division (BESE), King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi ArabiaABSTRACTStimulated Raman scattering (SRS) microscopy has gained popularity in recent years due to its linearity to molecule concentration and laser intensity, and to the lack of the nonresonant background that affects its analogous technique, coherent anti-Stokes Raman scattering. However, SRS is not a background-free technique. In fact, there are other optical processes – nonlinear transient scattering and nonlinear transient absorption – that can be detrimental to the contrast and sensitivity of SRS microscopy. In this review, we provide a description of these competing optical processes and present an up-to-date description of current solutions to minimize their effect on SRS measurements.https://www.tandfonline.com/doi/10.1080/23746149.2023.2176258Coherent Raman scattering microscopystimulated Raman scatteringlabel-free microscopymulti-photon microscopy
spellingShingle Luca Genchi
Sergey P. Laptenok
Carlo Liberale
Background signals in stimulated Raman scattering microscopy and current solutions to avoid them
Advances in Physics: X
Coherent Raman scattering microscopy
stimulated Raman scattering
label-free microscopy
multi-photon microscopy
title Background signals in stimulated Raman scattering microscopy and current solutions to avoid them
title_full Background signals in stimulated Raman scattering microscopy and current solutions to avoid them
title_fullStr Background signals in stimulated Raman scattering microscopy and current solutions to avoid them
title_full_unstemmed Background signals in stimulated Raman scattering microscopy and current solutions to avoid them
title_short Background signals in stimulated Raman scattering microscopy and current solutions to avoid them
title_sort background signals in stimulated raman scattering microscopy and current solutions to avoid them
topic Coherent Raman scattering microscopy
stimulated Raman scattering
label-free microscopy
multi-photon microscopy
url https://www.tandfonline.com/doi/10.1080/23746149.2023.2176258
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