Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure

We have studied the optical band and defect transitions of ScN, a group IIIB transition metal nitride semiconductor with electronic and optoelectronic applications. Recent works have focused on the degenerate nature of ScN by substitutional impurities ON and FN, which shift the direct (X–X) gap tran...

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Main Authors: Micah S. Haseman, Brenton A. Noesges, Seth Shields, John S. Cetnar, Amber N. Reed, Hayder A. Al-Atabi, James H. Edgar, Leonard J. Brillson
Format: Article
Language:English
Published: AIP Publishing LLC 2020-08-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0019533
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author Micah S. Haseman
Brenton A. Noesges
Seth Shields
John S. Cetnar
Amber N. Reed
Hayder A. Al-Atabi
James H. Edgar
Leonard J. Brillson
author_facet Micah S. Haseman
Brenton A. Noesges
Seth Shields
John S. Cetnar
Amber N. Reed
Hayder A. Al-Atabi
James H. Edgar
Leonard J. Brillson
author_sort Micah S. Haseman
collection DOAJ
description We have studied the optical band and defect transitions of ScN, a group IIIB transition metal nitride semiconductor with electronic and optoelectronic applications. Recent works have focused on the degenerate nature of ScN by substitutional impurities ON and FN, which shift the direct (X–X) gap transition to higher energies via the Burstein–Moss effect. We used cathodoluminescence spectroscopy (CLS) to observe optical signatures of both the midgap VN precursor to ON doping as well as above the direct (X–X) bandgap corresponding to band-to-band transitions from four separate conduction bands near the Γ point with the valence band minimum, in agreement with the calculated band structure diagrams. Thin film ScN grown by reactive magnetron sputtering displays mild degenerate doping by substitutional oxygen as indicated by elevated (X–X) transition energies and the presence of Sc–O bonding determined via x-ray photoelectron spectroscopy (XPS), while ScN grown by physical vapor transport exhibited the intrinsic, non-degenerate (X–X) bandgap predicted by theory. CLS reveals a sharp, sub-bandgap emission at 1.26 eV for sputter grown ScN on GaN, which we attribute to nitrogen vacancies (VN) based on surface sensitive CLS and XPS chemical trends. This finding is in strong agreement with theoretical calculations for VN predicting the formation of a defect energy level within the gap.
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spelling doaj.art-8daa355054074a39bddb5e3e30035d4e2022-12-21T18:31:01ZengAIP Publishing LLCAPL Materials2166-532X2020-08-0188081103081103-710.1063/5.0019533Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structureMicah S. Haseman0Brenton A. Noesges1Seth Shields2John S. Cetnar3Amber N. Reed4Hayder A. Al-Atabi5James H. Edgar6Leonard J. Brillson7Department of Physics, The Ohio State University, Columbus, Ohio 43210, USADepartment of Physics, The Ohio State University, Columbus, Ohio 43210, USADepartment of Physics, The Ohio State University, Columbus, Ohio 43210, USAAir Force Research Laboratory, Sensors Directorate, Wright Patterson AFB, Ohio 45433, USAAir Force Research Laboratory, Materials and Manufacturing Directorate, Wright Patterson AFB, Ohio 45433, USATim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, USATim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, USADepartment of Physics, The Ohio State University, Columbus, Ohio 43210, USAWe have studied the optical band and defect transitions of ScN, a group IIIB transition metal nitride semiconductor with electronic and optoelectronic applications. Recent works have focused on the degenerate nature of ScN by substitutional impurities ON and FN, which shift the direct (X–X) gap transition to higher energies via the Burstein–Moss effect. We used cathodoluminescence spectroscopy (CLS) to observe optical signatures of both the midgap VN precursor to ON doping as well as above the direct (X–X) bandgap corresponding to band-to-band transitions from four separate conduction bands near the Γ point with the valence band minimum, in agreement with the calculated band structure diagrams. Thin film ScN grown by reactive magnetron sputtering displays mild degenerate doping by substitutional oxygen as indicated by elevated (X–X) transition energies and the presence of Sc–O bonding determined via x-ray photoelectron spectroscopy (XPS), while ScN grown by physical vapor transport exhibited the intrinsic, non-degenerate (X–X) bandgap predicted by theory. CLS reveals a sharp, sub-bandgap emission at 1.26 eV for sputter grown ScN on GaN, which we attribute to nitrogen vacancies (VN) based on surface sensitive CLS and XPS chemical trends. This finding is in strong agreement with theoretical calculations for VN predicting the formation of a defect energy level within the gap.http://dx.doi.org/10.1063/5.0019533
spellingShingle Micah S. Haseman
Brenton A. Noesges
Seth Shields
John S. Cetnar
Amber N. Reed
Hayder A. Al-Atabi
James H. Edgar
Leonard J. Brillson
Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure
APL Materials
title Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure
title_full Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure
title_fullStr Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure
title_full_unstemmed Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure
title_short Cathodoluminescence and x-ray photoelectron spectroscopy of ScN: Dopant, defects, and band structure
title_sort cathodoluminescence and x ray photoelectron spectroscopy of scn dopant defects and band structure
url http://dx.doi.org/10.1063/5.0019533
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