Sub-10 fJ/bit radiation-hard nanoelectromechanical non-volatile memory

Achieving both low energy consumption and radiation-hardness is highly challenging in memory devices. Here, the authors demonstrate a sub-10 fJ/bit, radiation-hard nanoelectromechanical non-volatile memory through structural and material approaches.

Bibliographic Details
Main Authors: Yong-Bok Lee, Min-Ho Kang, Pan-Kyu Choi, Su-Hyun Kim, Tae-Soo Kim, So-Young Lee, Jun-Bo Yoon
Format: Article
Language:English
Published: Nature Portfolio 2023-01-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-023-36076-0