Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Abstract Quantitative analysis of materials from Heavy Ion PIXE spectra remains impeded by the lack of reliable X-ray production cross section (XPCS) data. Although efforts at experimental Heavy Ion induced XPCS measurements still continue, Multiple Ionisation (MI) effects, which are not fully descr...

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Main Authors: M. C. Masekane, M. Msimanga, I. Bogdanović Radović, M. Madhuku, S. J. Moloi
Format: Article
Language:English
Published: Nature Portfolio 2023-11-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-023-48217-y
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author M. C. Masekane
M. Msimanga
I. Bogdanović Radović
M. Madhuku
S. J. Moloi
author_facet M. C. Masekane
M. Msimanga
I. Bogdanović Radović
M. Madhuku
S. J. Moloi
author_sort M. C. Masekane
collection DOAJ
description Abstract Quantitative analysis of materials from Heavy Ion PIXE spectra remains impeded by the lack of reliable X-ray production cross section (XPCS) data. Although efforts at experimental Heavy Ion induced XPCS measurements still continue, Multiple Ionisation (MI) effects, which are not fully described by theory, render simulations of heavy ion PIXE data unreliable for large Z1/Z2 collisions, especially at low energies. This is also exacerbated by the random selection of projectile-target combinations for measured and reported experimental data available to validate theory. This study explored heavy ion induced X-ray production cross section deviations from those induced by protons at the same ion velocity. This enabled evaluations of the degree to which cross sections are enhanced through MI effects, with the aim of predicting XPCS due to heavy ion impact. The evaluation was carried out through the scaling of experimental heavy ion to theoretical proton cross section ratios (R), which were then used for the interpolation of XPCS in the same target element for ‘missing’ projectiles within the range of evaluation. Here we present measurements of heavy ion induced total L-shell XPCS in Bi, carried out to determine HI/p MI induced deviations due to C, F, Cl and Ti projectiles at an ion velocity range of (0.2–1.0) MeV/nucleon.
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spelling doaj.art-8e7d8559106f40e7b3d147e070b51f432023-12-03T12:22:16ZengNature PortfolioScientific Reports2045-23222023-11-0113111210.1038/s41598-023-48217-ySemi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXEM. C. Masekane0M. Msimanga1I. Bogdanović Radović2M. Madhuku3S. J. Moloi4Department of Physics, University of South AfricaiThemba LABS TAMS, National Research FoundationRuđer Bošković InstituteiThemba LABS TAMS, National Research FoundationDepartment of Physics, University of South AfricaAbstract Quantitative analysis of materials from Heavy Ion PIXE spectra remains impeded by the lack of reliable X-ray production cross section (XPCS) data. Although efforts at experimental Heavy Ion induced XPCS measurements still continue, Multiple Ionisation (MI) effects, which are not fully described by theory, render simulations of heavy ion PIXE data unreliable for large Z1/Z2 collisions, especially at low energies. This is also exacerbated by the random selection of projectile-target combinations for measured and reported experimental data available to validate theory. This study explored heavy ion induced X-ray production cross section deviations from those induced by protons at the same ion velocity. This enabled evaluations of the degree to which cross sections are enhanced through MI effects, with the aim of predicting XPCS due to heavy ion impact. The evaluation was carried out through the scaling of experimental heavy ion to theoretical proton cross section ratios (R), which were then used for the interpolation of XPCS in the same target element for ‘missing’ projectiles within the range of evaluation. Here we present measurements of heavy ion induced total L-shell XPCS in Bi, carried out to determine HI/p MI induced deviations due to C, F, Cl and Ti projectiles at an ion velocity range of (0.2–1.0) MeV/nucleon.https://doi.org/10.1038/s41598-023-48217-y
spellingShingle M. C. Masekane
M. Msimanga
I. Bogdanović Radović
M. Madhuku
S. J. Moloi
Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE
Scientific Reports
title Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE
title_full Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE
title_fullStr Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE
title_full_unstemmed Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE
title_short Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE
title_sort semi empirical parameterization of hi p l shell x ray production cross section ratios in bi for heavy ion pixe
url https://doi.org/10.1038/s41598-023-48217-y
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