Light emission from silicon with tin-containing nanocrystals

Tin-containing nanocrystals, embedded in silicon, have been fabricated by growing an epitaxial layer of Si1−x−ySnxCy, where x = 1.6 % and y = 0.04 % on a silicon substrate, followed by annealing at various temperatures ranging from 650 ∘C to 900 ∘C. The nanocrystal density and average diameters are...

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Main Authors: Søren Roesgaard, Jacques Chevallier, Peter I. Gaiduk, John Lundsgaard Hansen, Pia Bomholt Jensen, Arne Nylandsted Larsen, Axel Svane, Peter Balling, Brian Julsgaard
Format: Article
Language:English
Published: AIP Publishing LLC 2015-07-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4926596
_version_ 1817996825449201664
author Søren Roesgaard
Jacques Chevallier
Peter I. Gaiduk
John Lundsgaard Hansen
Pia Bomholt Jensen
Arne Nylandsted Larsen
Axel Svane
Peter Balling
Brian Julsgaard
author_facet Søren Roesgaard
Jacques Chevallier
Peter I. Gaiduk
John Lundsgaard Hansen
Pia Bomholt Jensen
Arne Nylandsted Larsen
Axel Svane
Peter Balling
Brian Julsgaard
author_sort Søren Roesgaard
collection DOAJ
description Tin-containing nanocrystals, embedded in silicon, have been fabricated by growing an epitaxial layer of Si1−x−ySnxCy, where x = 1.6 % and y = 0.04 % on a silicon substrate, followed by annealing at various temperatures ranging from 650 ∘C to 900 ∘C. The nanocrystal density and average diameters are determined by scanning transmission-electron microscopy to ≈1017 cm−3 and ≈5 nm, respectively. Photoluminescence spectroscopy demonstrates that the light emission is very pronounced for samples annealed at 725 ∘C, and Rutherford back-scattering spectrometry shows that the nanocrystals are predominantly in the diamond-structured phase at this particular annealing temperature. The origin of the light emission is discussed.
first_indexed 2024-04-14T02:29:00Z
format Article
id doaj.art-8f1de2ba40134b019ceabfd066790842
institution Directory Open Access Journal
issn 2158-3226
language English
last_indexed 2024-04-14T02:29:00Z
publishDate 2015-07-01
publisher AIP Publishing LLC
record_format Article
series AIP Advances
spelling doaj.art-8f1de2ba40134b019ceabfd0667908422022-12-22T02:17:46ZengAIP Publishing LLCAIP Advances2158-32262015-07-0157077114077114-610.1063/1.4926596015507ADVLight emission from silicon with tin-containing nanocrystalsSøren Roesgaard0Jacques Chevallier1Peter I. Gaiduk2John Lundsgaard Hansen3Pia Bomholt Jensen4Arne Nylandsted Larsen5Axel Svane6Peter Balling7Brian Julsgaard8Interdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkInterdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkBelarussian State University, Praspyekt Nyezalyezhnastsi 4, 220030 Minsk, BelarusInterdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkInterdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkInterdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkDepartment of Physics and Astronomy, Aarhus University, Ny Munkegade 120, DK-8000 Aarhus C, DenmarkInterdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkInterdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wieds Vej 14, DK-8000 Aarhus C, DenmarkTin-containing nanocrystals, embedded in silicon, have been fabricated by growing an epitaxial layer of Si1−x−ySnxCy, where x = 1.6 % and y = 0.04 % on a silicon substrate, followed by annealing at various temperatures ranging from 650 ∘C to 900 ∘C. The nanocrystal density and average diameters are determined by scanning transmission-electron microscopy to ≈1017 cm−3 and ≈5 nm, respectively. Photoluminescence spectroscopy demonstrates that the light emission is very pronounced for samples annealed at 725 ∘C, and Rutherford back-scattering spectrometry shows that the nanocrystals are predominantly in the diamond-structured phase at this particular annealing temperature. The origin of the light emission is discussed.http://dx.doi.org/10.1063/1.4926596
spellingShingle Søren Roesgaard
Jacques Chevallier
Peter I. Gaiduk
John Lundsgaard Hansen
Pia Bomholt Jensen
Arne Nylandsted Larsen
Axel Svane
Peter Balling
Brian Julsgaard
Light emission from silicon with tin-containing nanocrystals
AIP Advances
title Light emission from silicon with tin-containing nanocrystals
title_full Light emission from silicon with tin-containing nanocrystals
title_fullStr Light emission from silicon with tin-containing nanocrystals
title_full_unstemmed Light emission from silicon with tin-containing nanocrystals
title_short Light emission from silicon with tin-containing nanocrystals
title_sort light emission from silicon with tin containing nanocrystals
url http://dx.doi.org/10.1063/1.4926596
work_keys_str_mv AT sørenroesgaard lightemissionfromsiliconwithtincontainingnanocrystals
AT jacqueschevallier lightemissionfromsiliconwithtincontainingnanocrystals
AT peterigaiduk lightemissionfromsiliconwithtincontainingnanocrystals
AT johnlundsgaardhansen lightemissionfromsiliconwithtincontainingnanocrystals
AT piabomholtjensen lightemissionfromsiliconwithtincontainingnanocrystals
AT arnenylandstedlarsen lightemissionfromsiliconwithtincontainingnanocrystals
AT axelsvane lightemissionfromsiliconwithtincontainingnanocrystals
AT peterballing lightemissionfromsiliconwithtincontainingnanocrystals
AT brianjulsgaard lightemissionfromsiliconwithtincontainingnanocrystals