Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique
A speckle-based method for the X-ray crystal diffraction wavefront measurement is implemented, and the slope errors of channel-cut crystals with different surface characteristics are measured. The method uses a speckle scanning technique generated by a scattering membrane translated using a piezo mo...
Main Authors: | Lian Xue, Hongxin Luo, Qianshun Diao, Fugui Yang, Jie Wang, Zhongliang Li |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-11-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/20/22/6660 |
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