Reliability Analysis of FinFET Based High Performance Circuits
In the VLSI industry, the ability to anticipate variability tolerance is essential to understanding the circuits’ potential future performance. The cadence virtuoso tool is used in this study to assess how PVT fluctuations affect various fin-shaped field effect transistor (FinFET) circuits. In this...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-03-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/12/6/1407 |