Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications
Radiodiagnostic technologies are powerful tools for preventing diseases and monitoring the condition of patients. Medicine and sectors such as industry and research all use this inspection methodology. This field demands innovative and more sophisticated systems and materials for improving resolutio...
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2022-06-01
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author | Alessia De Martinis Luigi Montalto Lorenzo Scalise Daniele Rinaldi Paolo Mengucci Christos Michail George Fountos Nicki Martini Vaia Koukou Ioannis Valais Athanasios Bakas Christine Fountzoula Ioannis Kandarakis Stratos David |
author_facet | Alessia De Martinis Luigi Montalto Lorenzo Scalise Daniele Rinaldi Paolo Mengucci Christos Michail George Fountos Nicki Martini Vaia Koukou Ioannis Valais Athanasios Bakas Christine Fountzoula Ioannis Kandarakis Stratos David |
author_sort | Alessia De Martinis |
collection | DOAJ |
description | Radiodiagnostic technologies are powerful tools for preventing diseases and monitoring the condition of patients. Medicine and sectors such as industry and research all use this inspection methodology. This field demands innovative and more sophisticated systems and materials for improving resolution and sensitivity, leading to a faster, reliable, and safe diagnosis. In this study, a large characterization of gadolinium oxysulfide (Gd<sub>2</sub>O<sub>2</sub>S) scintillator screens for imaging applications has been carried out. Seven scintillator samples were doped with praseodymium (Pr<sup>3+</sup>), terbium (Tb<sup>3+</sup>) activators and co-doped with praseodymium, cerium, and fluorine (Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F). The sample screens were prepared in the laboratory in the form of high packing density screens, following the methodology used in screen sample preparation in infrared spectroscopy and luminescence. Parameters such as quantum detection efficiency (QDE), energy absorption efficiency (EAE), and absolute luminescence efficiency (ALE) were evaluated. In parallel, a structural characterization was performed, via XRD and SEM analysis, for quality control purposes as well as for correlation with optical properties. Spatial resolution properties were experimentally evaluated via the Modulation Transfer Function. Results were compared with published data about Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F screens produced with a standard method of a sedimentation technique. In particular, the ALE rose with the X-ray tube voltage up to 100 kVp, while among the different dopants, Gd<sub>2</sub>O<sub>2</sub>S:Pr exhibited the highest ALE value. When comparing screens with different thicknesses, a linear trend for the ALE value was not observed; the highest ALE value was measured for the 0.57 mm thick Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F sample, while the best MTF values were found in the thinner Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F screen with 0.38 mm thickness. |
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spelling | doaj.art-8f8ce1342d454e0da5a10d2886f4b12a2023-11-23T16:13:04ZengMDPI AGCrystals2073-43522022-06-0112685410.3390/cryst12060854Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging ApplicationsAlessia De Martinis0Luigi Montalto1Lorenzo Scalise2Daniele Rinaldi3Paolo Mengucci4Christos Michail5George Fountos6Nicki Martini7Vaia Koukou8Ioannis Valais9Athanasios Bakas10Christine Fountzoula11Ioannis Kandarakis12Stratos David13Dipartimento di Ingegneria Industriale e Scienze Matematiche, Università Politecnica delle Marche, 60131 Ancona, ItalyDipartimento SIMAU, Università Politecnica delle Marche, 60131 Ancona, ItalyDipartimento di Ingegneria Industriale e Scienze Matematiche, Università Politecnica delle Marche, 60131 Ancona, ItalyDipartimento SIMAU, Università Politecnica delle Marche, 60131 Ancona, ItalyDipartimento SIMAU, Università Politecnica delle Marche, 60131 Ancona, ItalyRadiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, University of West Attica, 60131 Athens, GreeceRadiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, University of West Attica, 60131 Athens, GreeceRadiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, University of West Attica, 60131 Athens, GreeceRadiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, University of West Attica, 60131 Athens, GreeceRadiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, University of West Attica, 60131 Athens, GreeceDepartment of Biomedical Sciences, University of West Attica, 12210 Athens, GreeceDepartment of Biomedical Sciences, University of West Attica, 12210 Athens, GreeceRadiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, University of West Attica, 60131 Athens, GreeceDepartment of Biomedical Engineering, University of West Attica, 12210 Athens, GreeceRadiodiagnostic technologies are powerful tools for preventing diseases and monitoring the condition of patients. Medicine and sectors such as industry and research all use this inspection methodology. This field demands innovative and more sophisticated systems and materials for improving resolution and sensitivity, leading to a faster, reliable, and safe diagnosis. In this study, a large characterization of gadolinium oxysulfide (Gd<sub>2</sub>O<sub>2</sub>S) scintillator screens for imaging applications has been carried out. Seven scintillator samples were doped with praseodymium (Pr<sup>3+</sup>), terbium (Tb<sup>3+</sup>) activators and co-doped with praseodymium, cerium, and fluorine (Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F). The sample screens were prepared in the laboratory in the form of high packing density screens, following the methodology used in screen sample preparation in infrared spectroscopy and luminescence. Parameters such as quantum detection efficiency (QDE), energy absorption efficiency (EAE), and absolute luminescence efficiency (ALE) were evaluated. In parallel, a structural characterization was performed, via XRD and SEM analysis, for quality control purposes as well as for correlation with optical properties. Spatial resolution properties were experimentally evaluated via the Modulation Transfer Function. Results were compared with published data about Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F screens produced with a standard method of a sedimentation technique. In particular, the ALE rose with the X-ray tube voltage up to 100 kVp, while among the different dopants, Gd<sub>2</sub>O<sub>2</sub>S:Pr exhibited the highest ALE value. When comparing screens with different thicknesses, a linear trend for the ALE value was not observed; the highest ALE value was measured for the 0.57 mm thick Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F sample, while the best MTF values were found in the thinner Gd<sub>2</sub>O<sub>2</sub>S:Pr,Ce,F screen with 0.38 mm thickness.https://www.mdpi.com/2073-4352/12/6/854inorganic scintillatorsGd<sub>2</sub>O<sub>2</sub>S (GOS)radiation detectorscharacterization |
spellingShingle | Alessia De Martinis Luigi Montalto Lorenzo Scalise Daniele Rinaldi Paolo Mengucci Christos Michail George Fountos Nicki Martini Vaia Koukou Ioannis Valais Athanasios Bakas Christine Fountzoula Ioannis Kandarakis Stratos David Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications Crystals inorganic scintillators Gd<sub>2</sub>O<sub>2</sub>S (GOS) radiation detectors characterization |
title | Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications |
title_full | Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications |
title_fullStr | Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications |
title_full_unstemmed | Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications |
title_short | Luminescence and Structural Characterization of Gd<sub>2</sub>O<sub>2</sub>S Scintillators Doped with Tb<sup>3+</sup>, Ce<sup>3+</sup>, Pr<sup>3+</sup> and F for Imaging Applications |
title_sort | luminescence and structural characterization of gd sub 2 sub o sub 2 sub s scintillators doped with tb sup 3 sup ce sup 3 sup pr sup 3 sup and f for imaging applications |
topic | inorganic scintillators Gd<sub>2</sub>O<sub>2</sub>S (GOS) radiation detectors characterization |
url | https://www.mdpi.com/2073-4352/12/6/854 |
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