Powernet: SOI Lateral Power Device Breakdown Prediction With Deep Neural Networks

Powernet: SOI Lateral Power Device Breakdown Prediction With Deep Neural Networks

The breakdown performance is a critical metric for power device design. This paper explores the feasibility of efficiently predicting the breakdown performance of silicon on insulator (SOI) lateral power device using multi-layer neural networks as an alternative to expensive technology computer-aide...

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Bibliographic Details
Main Authors: Jing Chen, Mohamed Baker Alawieh, Yibo Lin, Maolin Zhang, Jun Zhang, Yufeng Guo, David Z. Pan
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Breakdown location
breakdown voltage
deep neural networks (DNN)
Gaussian process regression (GPR)
SOI lateral power device
Online Access:https://ieeexplore.ieee.org/document/8978944/

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