Characterization of Chromium Compensated GaAs Sensors with the Charge-Integrating JUNGFRAU Readout Chip by Means of a Highly Collimated Pencil Beam

Characterization of Chromium Compensated GaAs Sensors with the Charge-Integrating JUNGFRAU Readout Chip by Means of a Highly Collimated Pencil Beam

Chromium compensated GaAs or GaAs:Cr sensors provided by the Tomsk State University (Russia) were characterized using the low noise, charge integrating readout chip JUNGFRAU with a pixel pitch of 75 × 75 µm<sup>2</sup> regarding its application as an X-ray detector at synchrotrons source...

Full description

Bibliographic Details
Main Authors: Dominic Greiffenberg, Marie Andrä, Rebecca Barten, Anna Bergamaschi, Martin Brückner, Paolo Busca, Sabina Chiriotti, Ivan Chsherbakov, Roberto Dinapoli, Pablo Fajardo, Erik Fröjdh, Shqipe Hasanaj, Pawel Kozlowski, Carlos Lopez Cuenca, Anastassiya Lozinskaya, Markus Meyer, Davide Mezza, Aldo Mozzanica, Sophie Redford, Marie Ruat, Christian Ruder, Bernd Schmitt, Dhanya Thattil, Gemma Tinti, Oleg Tolbanov, Anton Tyazhev, Seraphin Vetter, Andrei Zarubin, Jiaguo Zhang
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Sensors
Subjects:
GaAs
chromium compensated
JUNGFRAU
crater effect
effective pixel size
pencil beam
Online Access:https://www.mdpi.com/1424-8220/21/4/1550

Similar Items

Similar Items