Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus
In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphor...
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MDPI AG
2020-12-01
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| Online Access: | https://www.mdpi.com/1996-1944/13/24/5736 |
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| author | Aaron M. Ross Giuseppe M. Paternò Stefano Dal Conte Francesco Scotognella Eugenio Cinquanta |
| author_facet | Aaron M. Ross Giuseppe M. Paternò Stefano Dal Conte Francesco Scotognella Eugenio Cinquanta |
| author_sort | Aaron M. Ross |
| collection | DOAJ |
| description | In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction. |
| first_indexed | 2024-03-10T14:02:13Z |
| format | Article |
| id | doaj.art-9141fe61f27e4da684f5cd725f8b86c1 |
| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-10T14:02:13Z |
| publishDate | 2020-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Materials |
| spelling | doaj.art-9141fe61f27e4da684f5cd725f8b86c12023-11-21T01:02:19ZengMDPI AGMaterials1996-19442020-12-011324573610.3390/ma13245736Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black PhosphorusAaron M. Ross0Giuseppe M. Paternò1Stefano Dal Conte2Francesco Scotognella3Eugenio Cinquanta4Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milan, ItalyCenter for Nano Science and Technology@PoliMi, Istituto Italiano di Tecnologia (IIT), Via Giovanni Pascoli, 70/3, 20133 Milan, ItalyDipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milan, ItalyDipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milan, ItalyIstituto di Fotonica e Nanotecnologie, Consiglio Nazionale delle Ricerche, 20133 Milan, ItalyIn this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.https://www.mdpi.com/1996-1944/13/24/5736transition metal dichalcogenidesblack phosphorustwo-dimensional materialscomplex refractive indexKramers–Kronig analysis |
| spellingShingle | Aaron M. Ross Giuseppe M. Paternò Stefano Dal Conte Francesco Scotognella Eugenio Cinquanta Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus Materials transition metal dichalcogenides black phosphorus two-dimensional materials complex refractive index Kramers–Kronig analysis |
| title | Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus |
| title_full | Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus |
| title_fullStr | Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus |
| title_full_unstemmed | Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus |
| title_short | Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus |
| title_sort | anisotropic complex refractive indices of atomically thin materials determination of the optical constants of few layer black phosphorus |
| topic | transition metal dichalcogenides black phosphorus two-dimensional materials complex refractive index Kramers–Kronig analysis |
| url | https://www.mdpi.com/1996-1944/13/24/5736 |
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