A Ratiometric Wavelength Measurement Based on a Silicon-on-Insulator Directional Coupler Integrated Device

A Ratiometric Wavelength Measurement Based on a Silicon-on-Insulator Directional Coupler Integrated Device

A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the i...

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Bibliographic Details
Main Authors: Pengfei Wang, Agus Muhamad Hatta, Haoyu Zhao, Jie Zheng, Gerald Farrell, Gilberto Brambilla
Format: Article
Language:English
Published: MDPI AG 2015-08-01
Series:Sensors
Subjects:
directional coupler
wavelength monitor
integrated optics
Online Access:http://www.mdpi.com/1424-8220/15/9/21280

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