Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve

Abstract The accuracy and reliability of circuit board fault detection are significantly influenced by the uncertainty inherent in the VI curve. Here, an ensemble neural network is proposed, which combines the neural network‐based prediction interval and ensemble approaches, to improve the accuracy...

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Main Authors: Qingguo Pan, Yan Zhao, Zheng Zhao, Peng Lin
Format: Article
Language:English
Published: Wiley 2024-03-01
Series:Electronics Letters
Subjects:
Online Access:https://doi.org/10.1049/ell2.13147
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author Qingguo Pan
Yan Zhao
Zheng Zhao
Peng Lin
author_facet Qingguo Pan
Yan Zhao
Zheng Zhao
Peng Lin
author_sort Qingguo Pan
collection DOAJ
description Abstract The accuracy and reliability of circuit board fault detection are significantly influenced by the uncertainty inherent in the VI curve. Here, an ensemble neural network is proposed, which combines the neural network‐based prediction interval and ensemble approaches, to improve the accuracy of fault detection using the VI curve. First, a loss function with multiple objectives is formulated by integrating curve fitting and prediction interval. The aim is to achieve the curve fitting between current and voltage while simultaneously determining the optimal upper and lower bounds of the prediction interval. Second, an ensemble approach is employed to reduce model uncertainty and derive the ultimate current predictions and intervals. These predictions and intervals are then used in a comparative approach to automatically detect faults in circuit boards. Finally, the effectiveness of the proposed algorithm in improving the accuracy of fault detection is verified on experimental circuit boards.
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spelling doaj.art-929847cec7774d0fa431cd332b8133bd2024-03-28T07:44:34ZengWileyElectronics Letters0013-51941350-911X2024-03-01606n/an/a10.1049/ell2.13147Constructing prediction intervals for circuit board fault detection: A neural network approach using VI CurveQingguo Pan0Yan Zhao1Zheng Zhao2Peng Lin3Wuhu State‐Owned Factory of Machining Wuhu Anhui ChinaArtificial Intelligence Institute Hangzhou Dianzi University Hangzhou ChinaArtificial Intelligence Institute Hangzhou Dianzi University Hangzhou ChinaArtificial Intelligence Institute Hangzhou Dianzi University Hangzhou ChinaAbstract The accuracy and reliability of circuit board fault detection are significantly influenced by the uncertainty inherent in the VI curve. Here, an ensemble neural network is proposed, which combines the neural network‐based prediction interval and ensemble approaches, to improve the accuracy of fault detection using the VI curve. First, a loss function with multiple objectives is formulated by integrating curve fitting and prediction interval. The aim is to achieve the curve fitting between current and voltage while simultaneously determining the optimal upper and lower bounds of the prediction interval. Second, an ensemble approach is employed to reduce model uncertainty and derive the ultimate current predictions and intervals. These predictions and intervals are then used in a comparative approach to automatically detect faults in circuit boards. Finally, the effectiveness of the proposed algorithm in improving the accuracy of fault detection is verified on experimental circuit boards.https://doi.org/10.1049/ell2.13147circuit boardsfault diagnosisneural networkprediction intervalsVI curve
spellingShingle Qingguo Pan
Yan Zhao
Zheng Zhao
Peng Lin
Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
Electronics Letters
circuit boards
fault diagnosis
neural network
prediction intervals
VI curve
title Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
title_full Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
title_fullStr Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
title_full_unstemmed Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
title_short Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
title_sort constructing prediction intervals for circuit board fault detection a neural network approach using vi curve
topic circuit boards
fault diagnosis
neural network
prediction intervals
VI curve
url https://doi.org/10.1049/ell2.13147
work_keys_str_mv AT qingguopan constructingpredictionintervalsforcircuitboardfaultdetectionaneuralnetworkapproachusingvicurve
AT yanzhao constructingpredictionintervalsforcircuitboardfaultdetectionaneuralnetworkapproachusingvicurve
AT zhengzhao constructingpredictionintervalsforcircuitboardfaultdetectionaneuralnetworkapproachusingvicurve
AT penglin constructingpredictionintervalsforcircuitboardfaultdetectionaneuralnetworkapproachusingvicurve