Constructing prediction intervals for circuit board fault detection: A neural network approach using VI Curve
Abstract The accuracy and reliability of circuit board fault detection are significantly influenced by the uncertainty inherent in the VI curve. Here, an ensemble neural network is proposed, which combines the neural network‐based prediction interval and ensemble approaches, to improve the accuracy...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-03-01
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| Series: | Electronics Letters |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/ell2.13147 |