Description and validation of a circular padding method for linear roughness measurements of short data lengths
Surface topography measurements are vital in industrial quality control. Linear roughness measurements are among the most preferred methods, being quick to perform and easy to interpret. The ISO 16610 standard series prescribes filters that can be used for most cases, but has limitations for restric...
Main Authors: | Stijn Schoeters, Wim Dewulf, Jean-Pierre Kruth, Han Haitjema, Bart Boeckmans |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2020-01-01
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Series: | MethodsX |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2215016120303423 |
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