Surface and Electrical Characterization of Bilayers Based on BiFeO<sub>3</sub> and VO<sub>2</sub>

Surface and Electrical Characterization of Bilayers Based on BiFeO<sub>3</sub> and VO<sub>2</sub>

Thin films of BiFeO<sub>3</sub>, VO<sub>2</sub>, and BiFeO<sub>3</sub>/VO<sub>2</sub> were grown on SrTiO<sub>3</sub>(100) and Al<sub>2</sub>O<sub>3</sub>(0001) monocrystalline substrates using radio frequency and di...

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Bibliographic Details
Main Authors: Jhonatan Martínez, Edgar Mosquera-Vargas, Víctor Fuenzalida, Marcos Flores, Gilberto Bolaños, Jesús Diosa
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Nanomaterials
Subjects:
thin films
BiFeO<sub>3</sub>/VO<sub>2</sub>
solid–solid interface
surface characterization
electrical property
Online Access:https://www.mdpi.com/2079-4991/12/15/2578

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