Calculating electrostatic interactions in atomic force microscopy with semiconductor samples

Calculating electrostatic interactions in atomic force microscopy with semiconductor samples

Electrostatic interactions are important in non-contact atomic force microscopy (AFM) measurement. Previous reports had focused on the calculation of electrostatic interactions in AFM with metal and dielectric samples, and the present work extended the discussion to semiconductor samples based on Gr...

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Bibliographic Details
Main Authors:	Jie Xu, Jinze Li, Wei Li
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2019-10-01
Series:	AIP Advances
Online Access:	http://dx.doi.org/10.1063/1.5110482

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