Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field
It is high of commercial importance to generate the grain refinement in alloys during solidification by means of electromagnetic fields. Two typical patterns of electromagnetic fields, pulsed electric currents (ECP) and traveling magnetic field (TMF), are frequently employed to produce the finer equ...
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| Format: | Article |
| Language: | English |
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MDPI AG
2016-07-01
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| Series: | Metals |
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| Online Access: | http://www.mdpi.com/2075-4701/6/7/170 |
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| author | Yunhu Zhang Xiangru Cheng Honggang Zhong Zhishuai Xu Lijuan Li Yongyong Gong Xincheng Miao Changjiang Song Qijie Zhai |
| author_facet | Yunhu Zhang Xiangru Cheng Honggang Zhong Zhishuai Xu Lijuan Li Yongyong Gong Xincheng Miao Changjiang Song Qijie Zhai |
| author_sort | Yunhu Zhang |
| collection | DOAJ |
| description | It is high of commercial importance to generate the grain refinement in alloys during solidification by means of electromagnetic fields. Two typical patterns of electromagnetic fields, pulsed electric currents (ECP) and traveling magnetic field (TMF), are frequently employed to produce the finer equiaxed grains in solidifying alloys. Various mechanisms were proposed to understand the grain refinement in alloys caused by ECP and TMF. In this paper, a comparative study is carried out in the same solidification regime to investigate the grain refinement of Al-7 wt. %Si alloy driven by ECP and TMF. Experimental results show that the application of ECP or TMF can cause the same grain refinement occurrence period, during which the refinement of primary Al continuously occurs. In addition, the related grain refinement mechanisms are reviewed and discussed, which shows the most likely one caused by ECP and TMF is the promoted dendrite fragmentation as the result of the ECP-induced or TMF-induced forced flow. It suggests that the same grain refinement process in alloys is provoked when ECP and TMF are applied in the same solidification regime, respectively. |
| first_indexed | 2024-12-13T18:08:56Z |
| format | Article |
| id | doaj.art-93b376c49ec44bf886ad7dfefabdbb25 |
| institution | Directory Open Access Journal |
| issn | 2075-4701 |
| language | English |
| last_indexed | 2024-12-13T18:08:56Z |
| publishDate | 2016-07-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Metals |
| spelling | doaj.art-93b376c49ec44bf886ad7dfefabdbb252022-12-21T23:36:01ZengMDPI AGMetals2075-47012016-07-016717010.3390/met6070170met6070170Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic FieldYunhu Zhang0Xiangru Cheng1Honggang Zhong2Zhishuai Xu3Lijuan Li4Yongyong Gong5Xincheng Miao6Changjiang Song7Qijie Zhai8State Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaState Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaState Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaState Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaState Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaCollege of Science, Shanghai University, Shanghai 200444, ChinaSchool of Materials Science and Engineering, University of Science and Technology Liaoning, Liaoning 114051, ChinaState Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaState Key Laboratory of Advanced Special Steels, Shanghai University, Shanghai 200072, ChinaIt is high of commercial importance to generate the grain refinement in alloys during solidification by means of electromagnetic fields. Two typical patterns of electromagnetic fields, pulsed electric currents (ECP) and traveling magnetic field (TMF), are frequently employed to produce the finer equiaxed grains in solidifying alloys. Various mechanisms were proposed to understand the grain refinement in alloys caused by ECP and TMF. In this paper, a comparative study is carried out in the same solidification regime to investigate the grain refinement of Al-7 wt. %Si alloy driven by ECP and TMF. Experimental results show that the application of ECP or TMF can cause the same grain refinement occurrence period, during which the refinement of primary Al continuously occurs. In addition, the related grain refinement mechanisms are reviewed and discussed, which shows the most likely one caused by ECP and TMF is the promoted dendrite fragmentation as the result of the ECP-induced or TMF-induced forced flow. It suggests that the same grain refinement process in alloys is provoked when ECP and TMF are applied in the same solidification regime, respectively.http://www.mdpi.com/2075-4701/6/7/170grain refinementsolidificationAl-Si alloyspulsed electric currenttraveling magnetic field |
| spellingShingle | Yunhu Zhang Xiangru Cheng Honggang Zhong Zhishuai Xu Lijuan Li Yongyong Gong Xincheng Miao Changjiang Song Qijie Zhai Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field Metals grain refinement solidification Al-Si alloys pulsed electric current traveling magnetic field |
| title | Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field |
| title_full | Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field |
| title_fullStr | Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field |
| title_full_unstemmed | Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field |
| title_short | Comparative Study on the Grain Refinement of Al-Si Alloy Solidified under the Impact of Pulsed Electric Current and Travelling Magnetic Field |
| title_sort | comparative study on the grain refinement of al si alloy solidified under the impact of pulsed electric current and travelling magnetic field |
| topic | grain refinement solidification Al-Si alloys pulsed electric current traveling magnetic field |
| url | http://www.mdpi.com/2075-4701/6/7/170 |
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