Study of Some Properties of SnO2 Thin Film

In this paper thin films of Tin oxide SnO2 was prepared by spray pyrolyess method on glass and pure silicon substrates at deposition temperature(300,400,500) Cᵒ, from Tin chloride at concentration(0.1 M) . The films thickness were about 0.1 ±0.02 μm and Atomization rate was about (1 nm/s). The test...

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Bibliographic Details
Main Author: Alaa A. Abdul-Hamead
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2013-08-01
Series:Engineering and Technology Journal
Subjects:
Online Access:https://etj.uotechnology.edu.iq/article_82585_baaa81dda3d66f88d57b3775d0afe16b.pdf
Description
Summary:In this paper thin films of Tin oxide SnO2 was prepared by spray pyrolyess method on glass and pure silicon substrates at deposition temperature(300,400,500) Cᵒ, from Tin chloride at concentration(0.1 M) . The films thickness were about 0.1 ±0.02 μm and Atomization rate was about (1 nm/s). The test was done on prepared film by XRD and optical microscopy addition to sensitivity to nitrous oxide gas at different test temperature (25, 50, 75,100) Cᵒ. Result shows that the crystallization increased by increasing deposing temperature and the sensitivity increased by rising the gas concentration or temperature.
ISSN:1681-6900
2412-0758