Empirical Regression Models for Estimating Multiyear Leaf Area Index of Rice from Several Vegetation Indices at the Field Scale
Leaf area index (LAI) is among the most important variables for monitoring crop growth and estimating grain yield. Previous reports have shown that LAI derived from remote sensing data can be effectively applied in crop growth simulation models for improving the accuracy of grain yield estimation....
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| Format: | Article |
| Language: | English |
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MDPI AG
2014-05-01
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| Series: | Remote Sensing |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2072-4292/6/6/4764 |